{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,7]],"date-time":"2026-01-07T08:02:14Z","timestamp":1767772934018,"version":"3.28.0"},"reference-count":31,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,11,1]]},"DOI":"10.1109\/itc44778.2020.9325263","type":"proceedings-article","created":{"date-parts":[[2021,1,20]],"date-time":"2021-01-20T16:17:10Z","timestamp":1611159430000},"page":"1-10","source":"Crossref","is-referenced-by-count":3,"title":["Automating Design For Yield: Silicon Learning to Predictive Models and Design Optimization"],"prefix":"10.1109","author":[{"given":"Srikanth Venkat","family":"Raman","sequence":"first","affiliation":[]},{"given":"Pongpachara","family":"Limpisathian","sequence":"additional","affiliation":[]},{"given":"Pascal","family":"Meinerzhagen","sequence":"additional","affiliation":[]},{"given":"Suriyaprakash","family":"Natarajan","sequence":"additional","affiliation":[]},{"given":"Eric","family":"Yang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2004.15"},{"journal-title":"Data sheet Design Compiler Graphical","year":"0","key":"ref30"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ASMC.2010.5551472"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699270"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2406854"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2017.8242050"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2004.15"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/VTS48691.2020.9107558"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2018.8624906"},{"journal-title":"Mentor Calibre","year":"0","key":"ref17"},{"journal-title":"Synopsys IC Validator","year":"0","key":"ref18"},{"key":"ref19","first-page":"281","article-title":"Some methods for classification and analysis of multivariate observations","author":"macqueen","year":"1967","journal-title":"Proc 5th Berkeley Symp on Mathematical Statistics and Probability"},{"journal-title":"White paper Signoff-Driven Timing Closure ECO in the Synopsys Galaxy Platform","year":"0","key":"ref28"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966644"},{"key":"ref27","first-page":"2825","article-title":"Scikit-learn: Machine Learning in Python","author":"pedregosa","year":"2011","journal-title":"JMLR 12"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2008.69"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/54.902819"},{"journal-title":"White paper Best Full-Flow PPA by Cadence","year":"0","key":"ref29"},{"key":"ref5","first-page":"1","article-title":"A logic diagnosis methodology for improved localization and extraction of accurate defect behavior","author":"desineni","year":"2006","journal-title":"Proc Int Test Conf"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700589"},{"key":"ref7","first-page":"12","article-title":"Experiences with layout-aware diagnosis - A case study","volume":"12","author":"chang","year":"2010","journal-title":"Electronic Device Failure Analysis"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2019.8715037"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2009.37"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/3325066"},{"key":"ref20","first-page":"801","article-title":"Sur la division des corps matériels en parties","volume":"4","author":"steinhaus","year":"1957","journal-title":"Bull Acad Polon Sci (in French)"},{"key":"ref22","first-page":"768","article-title":"Cluster analysis of multivariate data: efficiency versus interpretability of classifications","volume":"21","author":"forgy","year":"1965","journal-title":"Biometrics"},{"key":"ref21","article-title":"Least square quantization in PCM","author":"lloyd","year":"1957","journal-title":"Bell Telephone Laboratories"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1080\/03610927408827101"},{"key":"ref23","doi-asserted-by":"crossref","DOI":"10.1002\/9780470316801","author":"kaufman","year":"1990","journal-title":"Finding Groups in Data – An Introduction to Cluster Analysis"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1093\/bioinformatics\/btz470"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1145\/2908812.2908918"}],"event":{"name":"2020 IEEE International Test Conference (ITC)","start":{"date-parts":[[2020,11,1]]},"location":"Washington, DC, USA","end":{"date-parts":[[2020,11,6]]}},"container-title":["2020 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9325188\/9325208\/09325263.pdf?arnumber=9325263","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,10,18]],"date-time":"2023-10-18T05:04:45Z","timestamp":1697605485000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9325263\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,11,1]]},"references-count":31,"URL":"https:\/\/doi.org\/10.1109\/itc44778.2020.9325263","relation":{},"subject":[],"published":{"date-parts":[[2020,11,1]]}}}