{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T02:30:46Z","timestamp":1725589846465},"reference-count":10,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,11,1]]},"DOI":"10.1109\/itc44778.2020.9325275","type":"proceedings-article","created":{"date-parts":[[2021,1,20]],"date-time":"2021-01-20T21:17:10Z","timestamp":1611177430000},"page":"1-5","source":"Crossref","is-referenced-by-count":1,"title":["Test and Diagnosis Solution for Functional Safety"],"prefix":"10.1109","author":[{"given":"M.","family":"Casarsa","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"G.","family":"Harutyunyan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Y.","family":"Zorian","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","article-title":"A BIST Implementation Framework for Supporting Field Testability and Confligurability in an Automotive SOC","author":"dutta","year":"2007","journal-title":"Workshop on Dependaable and Secure Nanocomputing"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/12.543708"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2014.6818747"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2018.8624810"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2016.7477287"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2018.8624740"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ITC44170.2019.9000129"},{"year":"0","key":"ref2"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2011.98"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2017.8242075"}],"event":{"name":"2020 IEEE International Test Conference (ITC)","start":{"date-parts":[[2020,11,1]]},"location":"Washington, DC, USA","end":{"date-parts":[[2020,11,6]]}},"container-title":["2020 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9325188\/9325208\/09325275.pdf?arnumber=9325275","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,28]],"date-time":"2022-06-28T21:51:20Z","timestamp":1656453080000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9325275\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,11,1]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/itc44778.2020.9325275","relation":{},"subject":[],"published":{"date-parts":[[2020,11,1]]}}}