{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T15:23:30Z","timestamp":1725636210337},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/itw.2004.1405318","type":"proceedings-article","created":{"date-parts":[[2005,4,6]],"date-time":"2005-04-06T11:20:51Z","timestamp":1112786451000},"page":"298-303","source":"Crossref","is-referenced-by-count":16,"title":["On multiple access for distributed dependent sources: a content-based group testing approach"],"prefix":"10.1109","author":[{"family":"Yao-Win Hong","sequence":"first","affiliation":[]},{"given":"A.","family":"Scaglione","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/TCOM.1979.1094298"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1145\/570645.570663"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1002\/cpa.3160130105"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TCOM.1984.1096146"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1002\/j.1538-7305.1959.tb03914.x"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1214\/aoms\/1177731363"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/DCC.2000.838191"},{"key":"7","doi-asserted-by":"crossref","DOI":"10.1007\/3-540-36978-3_2","article-title":"Distributed sampling in dense sensor networks: A \"bit-conservation\" principle","author":"ishwar","year":"2003","journal-title":"Proc 3rd Workshop Information Processing in Sensor Networks"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2002.801124"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/78.258085"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.1985.1057026"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2002.808103"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2002.806145"}],"event":{"name":"2004 IEEE Information Theory Workshop","acronym":"ITW-04","location":"San Antonio, TX, USA"},"container-title":["Manufacturing Engineer"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9641\/30470\/01405318.pdf?arnumber=1405318","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,16]],"date-time":"2017-06-16T14:02:21Z","timestamp":1497621741000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1405318\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/itw.2004.1405318","relation":{},"subject":[]}}