{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,24]],"date-time":"2025-11-24T19:55:53Z","timestamp":1764014153967,"version":"3.45.0"},"reference-count":17,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,9,29]],"date-time":"2025-09-29T00:00:00Z","timestamp":1759104000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,9,29]],"date-time":"2025-09-29T00:00:00Z","timestamp":1759104000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100009950","name":"Ministry of Education","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100009950","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,9,29]]},"DOI":"10.1109\/itw62417.2025.11240479","type":"proceedings-article","created":{"date-parts":[[2025,11,21]],"date-time":"2025-11-21T18:39:40Z","timestamp":1763750380000},"page":"638-643","source":"Crossref","is-referenced-by-count":0,"title":["Meta-Transfer Learning-Based Few-Shot Data Detection for Resistive Memory Channels"],"prefix":"10.1109","author":[{"given":"Zhen","family":"Mei","sequence":"first","affiliation":[{"name":"Nanjing University of Science and Technology,School of Electronic and Optical Engineering,Nanjing,China,210094"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Minghui","family":"Ju","sequence":"additional","affiliation":[{"name":"Nanjing University of Science and Technology,School of Electronic and Optical Engineering,Nanjing,China,210094"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kui","family":"Cai","sequence":"additional","affiliation":[{"name":"Singapore University of Technology and Design,Science, Mathematics and Technology Cluster,Singapore,487372"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Guanghui","family":"Song","sequence":"additional","affiliation":[{"name":"Xidian University,School of Telecommunications Engineering,Xi’an,China,710071"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xingwei","family":"Zhong","sequence":"additional","affiliation":[{"name":"ST Engineering,Singapore,567764"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Long","family":"Shi","sequence":"additional","affiliation":[{"name":"Nanjing University of Science and Technology,School of Electronic and Optical Engineering,Nanjing,China,210094"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tuan Thanh","family":"Nguyen","sequence":"additional","affiliation":[{"name":"Singapore University of Technology and Design,Science, Mathematics and Technology Cluster,Singapore,487372"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MSSC.2016.2546199"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1038\/nature06932"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCOMM.2019.2897762"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/LCOMM.2023.3234247"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/LCOMM.2022.3186324"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCOMM.2021.3051413"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ITW.2018.8613449"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCOMM.2019.2948332"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISIT45174.2021.9517764"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCOMM.2022.3140459"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCOMM.2020.2974723"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/LCOMM.2022.3148292"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/IMW.2017.7939101"},{"key":"ref14","first-page":"1126","article-title":"Model-agnostic meta-learning for fast adaptation of deep networks","volume-title":"Proc. Int. Conf. on Mach. Learn","author":"Finn"},{"key":"ref15","first-page":"24 670","article-title":"Information-theoretic generalization bounds for black-box learning algorithms","volume-title":"Proc. Adv. Neural Inf. Process. Syst","volume":"34","author":"Harutyunyan"},{"key":"ref16","article-title":"Information-theoretic analysis of generalization capability of learning algorithms","volume-title":"Proc. Adv. Neural Inf. Process. Syst","volume":"30","author":"Xu"},{"key":"ref17","first-page":"25 878","article-title":"Generalization bounds for metalearning: An information-theoretic analysis","volume-title":"Proc. Adv. Neural Inf. Process. Syst","volume":"34","author":"Chen"}],"event":{"name":"2025 IEEE Information Theory Workshop (ITW)","start":{"date-parts":[[2025,9,29]]},"location":"Sydney, Australia","end":{"date-parts":[[2025,10,3]]}},"container-title":["2025 IEEE Information Theory Workshop (ITW)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11240243\/11240249\/11240479.pdf?arnumber=11240479","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,11,24]],"date-time":"2025-11-24T18:56:25Z","timestamp":1764010585000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11240479\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,9,29]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/itw62417.2025.11240479","relation":{},"subject":[],"published":{"date-parts":[[2025,9,29]]}}}