{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,9]],"date-time":"2025-04-09T08:32:16Z","timestamp":1744187536770,"version":"3.28.0"},"reference-count":26,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,12,1]],"date-time":"2019-12-01T00:00:00Z","timestamp":1575158400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,12,1]],"date-time":"2019-12-01T00:00:00Z","timestamp":1575158400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,12,1]],"date-time":"2019-12-01T00:00:00Z","timestamp":1575158400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,12]]},"DOI":"10.1109\/ivcnz48456.2019.8960991","type":"proceedings-article","created":{"date-parts":[[2020,1,17]],"date-time":"2020-01-17T02:21:23Z","timestamp":1579227683000},"page":"1-6","source":"Crossref","is-referenced-by-count":5,"title":["Accurate 3D Measurement of Highly Specular Surface using Laser and Stereo Reconstruction"],"prefix":"10.1109","author":[{"given":"Arpita","family":"Dawda","sequence":"first","affiliation":[]},{"given":"Minh","family":"Nguyen","sequence":"additional","affiliation":[]},{"given":"Reinhard","family":"Klette","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"In-sight Laser Profiler","year":"2019","key":"ref10"},{"journal-title":"Laser scanners for 2D\/3D profile measurements","year":"2019","key":"ref11"},{"key":"ref12","article-title":"High dynamic range scanning technique","volume":"48","author":"zhang","year":"2009","journal-title":"Optical Engineering"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1364\/AO.50.004557"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2011.11.021"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ISOT.2010.5687389"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1117\/1.OE.53.8.084109"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.precisioneng.2014.06.007"},{"key":"ref18","first-page":"4350","article-title":"Shape measurement of glossy objects by range finder with polarization optical system","volume":"200","author":"yoshinori","year":"2003","journal-title":"Gazo Denshi Gakkai Kenkyukai Koen Yoko"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2004.1273960"},{"journal-title":"Flexible & Intelligent manufacturing solutions","year":"2019","key":"ref4"},{"year":"2019","key":"ref3"},{"key":"ref6","first-page":"1022","article-title":"Overview of three-dimensional shape measurement using optical methods","volume":"39","author":"chen","year":"2000","journal-title":"Optical Engineering"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1155\/2017\/9576850"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4471-6320-6"},{"journal-title":"Stereo Vision 2017","year":"0","key":"ref7"},{"journal-title":"Machine Vision 2019","year":"0","key":"ref2"},{"journal-title":"Gocator 2500 Series","year":"2019","key":"ref9"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/0360-8352(91)90078-K"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2014.03.003"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2004.90"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1002\/col.5080100409"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1007\/s10946-018-9756-7"},{"key":"ref23","article-title":"A Novel Stereo Vision Measurement System Using Both Line Scan Camera and Frame Camera","author":"liu","year":"2018","journal-title":"IEEE Transactions on Instrumentation and Measurement"},{"journal-title":"Novel inspection system characterizes shiny reflective parts","year":"2019","key":"ref26"},{"journal-title":"Imaging micron-sized defects on reflective surfaces","year":"2019","key":"ref25"}],"event":{"name":"2019 International Conference on Image and Vision Computing New Zealand (IVCNZ)","start":{"date-parts":[[2019,12,2]]},"location":"Dunedin, New Zealand","end":{"date-parts":[[2019,12,4]]}},"container-title":["2019 International Conference on Image and Vision Computing New Zealand (IVCNZ)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8955481\/8960955\/08960991.pdf?arnumber=8960991","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,15]],"date-time":"2022-07-15T03:14:25Z","timestamp":1657854865000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8960991\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,12]]},"references-count":26,"URL":"https:\/\/doi.org\/10.1109\/ivcnz48456.2019.8960991","relation":{},"subject":[],"published":{"date-parts":[[2019,12]]}}}