{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,27]],"date-time":"2025-10-27T16:15:57Z","timestamp":1761581757251,"version":"3.28.0"},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,7]]},"DOI":"10.1109\/ivsw.2018.8494852","type":"proceedings-article","created":{"date-parts":[[2018,10,18]],"date-time":"2018-10-18T22:36:58Z","timestamp":1539902218000},"page":"68-73","source":"Crossref","is-referenced-by-count":17,"title":["A New Secure Stream Cipher for Scan Chain Encryption"],"prefix":"10.1109","author":[{"given":"Mathieu","family":"Da Silva","sequence":"first","affiliation":[]},{"given":"Emanuele","family":"Valea","sequence":"additional","affiliation":[]},{"given":"Marie-Lise","family":"Flottes","sequence":"additional","affiliation":[]},{"given":"Sophie","family":"Dupuis","sequence":"additional","affiliation":[]},{"given":"Giorgio","family":"Di Natale","sequence":"additional","affiliation":[]},{"given":"Bruno","family":"Rouzeyre","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","volume":"2001","author":"committee","year":"1990","journal-title":"IEEE standard test access port and boundary scan architecture"},{"journal-title":"IEEE Standard Testability Method for Embedded Core-based Integrated Circuits (2012) IEEE Std 1500–2005","year":"0","key":"ref11"},{"journal-title":"The IEEE Standards Association (2014) IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device","year":"0","key":"ref12"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.9"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2011.5783765"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/AsianHOST.2016.7835558"},{"journal-title":"DesignWare True Random Number Generator Core","year":"2015","key":"ref16"},{"journal-title":"Synopsys Design Compiler","year":"0","key":"ref17"},{"year":"0","author":"tetramax","key":"ref18"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2012.6231061"},{"key":"ref3","first-page":"19","article-title":"Scan Attacks and Countermeasures in Presence of Scan Response Compactors","author":"da rolt","year":"2011","journal-title":"European Test Symposium (ETS)"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2017.7968248"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-SoC.2013.6673281"},{"key":"ref8","article-title":"TRIVIUM Specifications","author":"de canniere","year":"2005","journal-title":"ECRYPT Stream Cipher Project Report 2005\/030"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IVSW.2017.8031543"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2005.193787"},{"key":"ref1","doi-asserted-by":"crossref","DOI":"10.1007\/978-3-662-04722-4","author":"daemen","year":"2002","journal-title":"The Design of Rijndael"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966696"}],"event":{"name":"2018 IEEE 3rd International Verification and Security Workshop (IVSW)","start":{"date-parts":[[2018,7,2]]},"location":"Costa Brava","end":{"date-parts":[[2018,7,4]]}},"container-title":["2018 IEEE 3rd International Verification and Security Workshop (IVSW)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8482238\/8494838\/08494852.pdf?arnumber=8494852","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,26]],"date-time":"2022-01-26T21:02:35Z","timestamp":1643230955000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8494852\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,7]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/ivsw.2018.8494852","relation":{},"subject":[],"published":{"date-parts":[[2018,7]]}}}