{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,9]],"date-time":"2026-03-09T23:59:16Z","timestamp":1773100756216,"version":"3.50.1"},"reference-count":67,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,7]]},"DOI":"10.1109\/ivsw.2018.8494856","type":"proceedings-article","created":{"date-parts":[[2018,10,18]],"date-time":"2018-10-18T18:36:58Z","timestamp":1539887818000},"page":"93-102","source":"Crossref","is-referenced-by-count":60,"title":["Physical Inspection & Attacks: New Frontier in Hardware Security"],"prefix":"10.1109","author":[{"given":"M Tanjidur","family":"Rahman","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Qihang","family":"Shi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shahin","family":"Tajik","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Haoting","family":"Shen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Damon L.","family":"Woodard","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mark","family":"Tehranipoor","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Navid","family":"Asadizanjani","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1145\/2508859.2516656"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2028166"},{"key":"ref33","first-page":"30","article-title":"Chip editor: leveraging circuit edit for logic obfuscation and trusted fabrication","author":"shakya","year":"2016","journal-title":"Proceedings of the 35th international conference on Computer-Aided Design"},{"key":"ref32","doi-asserted-by":"crossref","first-page":"12023","DOI":"10.1088\/1742-6596\/787\/1\/012023","article-title":"Counterfeit electronics detection using image processing and machine learning","volume":"787","author":"asadizanjani","year":"2017","journal-title":"Journal of Physics Conference Series"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2014.2332291"},{"key":"ref30","year":"0","journal-title":"Nanospective com"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1145\/1403375.1403631"},{"key":"ref36","first-page":"291","article-title":"Active hardware metering for intellectual property protection and security","author":"alkabani","year":"2007","journal-title":"USENIX Security Symposium"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2016.2601067"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2015.7140229"},{"key":"ref60","first-page":"41","article-title":"Simple photonic emission analysis of aes","author":"schl\u00f6sser","year":"2012","journal-title":"International Workshop on Cryptographic Hardware and Embedded Systems"},{"key":"ref62","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC.2009.37"},{"key":"ref61","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-662-44709-3_27"},{"key":"ref63","first-page":"1","article-title":"Differential photonic emission analysis","author":"kr\u00e4mer","year":"2013","journal-title":"International Workshop on Constructive Side-Channel Analysis and Secure Design Springer"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2011.5954999"},{"key":"ref64","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2012.6224328"},{"key":"ref27","doi-asserted-by":"crossref","first-page":"396","DOI":"10.1007\/978-3-642-04138-9_28","article-title":"Mero: A statistical approach for hardware trojan detection","author":"chakraborty","year":"2009","journal-title":"Cryptographic Hardware and Embedded Systems-CHES 2009"},{"key":"ref65","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2014.6855562"},{"key":"ref66","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2017.8046216"},{"key":"ref29","article-title":"Detecting hardware trojans inserted by untrusted foundry using physical inspection and advanced image processing techniques","author":"asadizanjani","year":"2018","journal-title":"Presentation"},{"key":"ref67","article-title":"Nanopyramid An optical scrambler against backside probing attacks","author":"shen","year":"2018","journal-title":"Presentation"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2014.2334493"},{"key":"ref1","article-title":"A survey of hardware trojan taxonomy and detection","volume":"27","author":"tehranipoor","year":"2010","journal-title":"IEEE Design & Test of Computers"},{"key":"ref20","year":"0","journal-title":"MicroNet Solutions Inc"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TCPMT.2016.2642824"},{"key":"ref21","year":"0","journal-title":"Welcome to the Degate Project Website"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/AHS.2010.5546257"},{"key":"ref23","first-page":"57","article-title":"Reverse engineering flash eeprom memories using scanning electron microscopy","author":"courbon","year":"2016","journal-title":"International Conference on Smart Card Research and Advanced Applications"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1145\/1403375.1403703"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2011.5954998"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC.2012.11"},{"key":"ref51","author":"laackmann","year":"2004","journal-title":"Apparatus for Protecting An Integrated Circuit Formed in A Substrate and Method for Protecting the Circuit Against Reverse Engineering"},{"key":"ref59","author":"schmidt","year":"2007","journal-title":"Optical and em fault-attacks on crt-based rsa Concrete results"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.1109\/IPFA.2016.7564288"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1109\/IPFA.2007.4378057"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2014.64"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2006.07.025"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2017.69"},{"key":"ref53","year":"0","journal-title":"Tarnovsky Deconstruct Processor - YouTube"},{"key":"ref52","first-page":"463","article-title":"Private circuits: Securing hardware against probing attacks","author":"ishai","year":"2003","journal-title":"6th Annual International Cryptology Conference"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC.2015.19"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/2508859.2516717"},{"key":"ref40","author":"chow","year":"2004","journal-title":"Integrated circuits protected against reverse engineering and method for fabricating the same using vias without metal terminations"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC.2013.13"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2017.2729398"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/2755563"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/IPFA.2016.7564318"},{"key":"ref16","doi-asserted-by":"crossref","first-page":"363","DOI":"10.1007\/978-3-642-04138-9_26","article-title":"The state-of-the-art in ic reverse engineering","author":"torrance","year":"2009","journal-title":"Cryptographic Hardware and Embedded Systems-CHES 2009"},{"key":"ref17","doi-asserted-by":"crossref","first-page":"402","DOI":"10.1038\/nature21698","article-title":"High-resolution non-destructive three-dimensional imaging of integrated circuits","volume":"543","author":"holler","year":"2017","journal-title":"Nature"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2017.2656839"},{"key":"ref19","year":"0","journal-title":"Techinsights com 2018"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2014.6783305"},{"key":"ref3","year":"0","journal-title":"Trusted Integrated Circuits (TRUST)"},{"key":"ref6","first-page":"41","article-title":"Simple photonic emission analysis of aes","author":"schl\u00f6sser","year":"2012","journal-title":"International Workshop on Cryptographic Hardware and Embedded Systems"},{"key":"ref5","article-title":"Hardware security of semiconductor chips: Progress and lessons","author":"skorobogatov","year":"2011","journal-title":"Presentation"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/3133956.3134039"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2014.6855569"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2014.6855563"},{"key":"ref9","first-page":"2","article-title":"Optical fault induction attacks","author":"skorobogatov","year":"2002","journal-title":"International Workshop on Cryptographic Hardware and Embedded Systems"},{"key":"ref46","year":"0","journal-title":"Nanoscale Device Characteristics Analysis System Nano-Prober NP6800"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2016.7495575"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2012.6224333"},{"key":"ref47","year":"0","journal-title":"Imina ch (2018) EBIC \/ EBAC Techniques for Semiconductor Failure Analysis — Imina Technologies SA"},{"key":"ref42","article-title":"Steps toward automated deprocessing of integrated circuits","author":"principe","year":"2017","journal-title":"43nd International Symposium for Testing and Failure Analysis"},{"key":"ref41","first-page":"6","article-title":"A new methodology to protect pcbs from non-destructive reverse engineering","author":"asadizanjani","year":"2016","journal-title":"International Symposium for Testing and Failure Analysis"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/IISA.2016.7785372"},{"key":"ref43","year":"0","journal-title":"Multisem 505\/506"}],"event":{"name":"2018 IEEE 3rd International Verification and Security Workshop (IVSW)","location":"Costa Brava","start":{"date-parts":[[2018,7,2]]},"end":{"date-parts":[[2018,7,4]]}},"container-title":["2018 IEEE 3rd International Verification and Security Workshop (IVSW)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8482238\/8494838\/08494856.pdf?arnumber=8494856","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,26]],"date-time":"2022-01-26T15:10:36Z","timestamp":1643209836000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8494856\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,7]]},"references-count":67,"URL":"https:\/\/doi.org\/10.1109\/ivsw.2018.8494856","relation":{},"subject":[],"published":{"date-parts":[[2018,7]]}}}