{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,10]],"date-time":"2026-03-10T14:47:16Z","timestamp":1773154036490,"version":"3.50.1"},"reference-count":32,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,6]]},"DOI":"10.1109\/iwasi.2017.7974215","type":"proceedings-article","created":{"date-parts":[[2017,7,13]],"date-time":"2017-07-13T16:49:01Z","timestamp":1499964541000},"page":"59-62","source":"Crossref","is-referenced-by-count":23,"title":["Cryogenic CMOS interfaces for quantum devices"],"prefix":"10.1109","author":[{"given":"Fabio","family":"Sebastiano","sequence":"first","affiliation":[]},{"given":"Harald A.R.","family":"Homulle","sequence":"additional","affiliation":[]},{"given":"Jeroen P.G.","family":"van Dijk","sequence":"additional","affiliation":[]},{"given":"Rosario M.","family":"Incandela","sequence":"additional","affiliation":[]},{"given":"Bishnu","family":"Patra","sequence":"additional","affiliation":[]},{"given":"Mohammadreza","family":"Mehrpoo","sequence":"additional","affiliation":[]},{"given":"Masoud","family":"Babaie","sequence":"additional","affiliation":[]},{"given":"Andrei","family":"Vladimirescu","sequence":"additional","affiliation":[]},{"given":"Edoardo","family":"Charbon","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1038\/npjqi.2015.11"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1063\/1.4979611"},{"key":"ref30","article-title":"Nanometer CMOS Characterization and Compact Modeling at Deep-Cryogenic Temperatures","author":"incandela","year":"2017","journal-title":"Proc 2017 European Solid-State Device ResearchConference"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1038\/ncomms5015"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevA.86.032324"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevA.90.022305"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevApplied.3.024010"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/2903150.2906828"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2017.7870362"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2016.7838410"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2009.2037381"},{"key":"ref18","article-title":"BlueFors Cryogenics","year":"0","journal-title":"XLD Series specifications"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1145\/3061639.3072948"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1049\/el.2010.3468"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1038\/nature13407"},{"key":"ref27","first-page":"98192b","article-title":"Extraction of static parameters to extend the EKV model to cryogenic temperatures","author":"fonseca","year":"2016","journal-title":"Proc SPIE"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2014.153"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevX.4.021044"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ICSENS.2016.7808759"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.110.046805"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1038\/ncomms7983"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1088\/0953-8984\/27\/15\/154205"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2017.7870244"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1038\/nature13171"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2016.293"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/16.925249"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.2014.6848614"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.877872"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.cryogenics.2013.10.003"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/WOLTE.2014.6881018"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2010.2046458"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2011.01.004"}],"event":{"name":"2017 7th IEEE International Workshop on Advances in Sensors and Interfaces (IWASI)","location":"Vieste, Italy","start":{"date-parts":[[2017,6,15]]},"end":{"date-parts":[[2017,6,16]]}},"container-title":["2017 7th IEEE International Workshop on Advances in Sensors and Interfaces (IWASI)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7963869\/7974188\/07974215.pdf?arnumber=7974215","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,8,16]],"date-time":"2017-08-16T12:02:18Z","timestamp":1502884938000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7974215\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,6]]},"references-count":32,"URL":"https:\/\/doi.org\/10.1109\/iwasi.2017.7974215","relation":{},"subject":[],"published":{"date-parts":[[2017,6]]}}}