{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,21]],"date-time":"2025-08-21T18:13:30Z","timestamp":1755800010228,"version":"3.44.0"},"reference-count":36,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,7,3]],"date-time":"2025-07-03T00:00:00Z","timestamp":1751500800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,7,3]],"date-time":"2025-07-03T00:00:00Z","timestamp":1751500800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,7,3]]},"DOI":"10.1109\/iwasi66786.2025.11121994","type":"proceedings-article","created":{"date-parts":[[2025,8,19]],"date-time":"2025-08-19T18:08:08Z","timestamp":1755626888000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Performance Evaluation of a MEMS Microgripper with Double-Sided Capacitive Sensing for High-Precision Micromanipulation"],"prefix":"10.1109","author":[{"given":"Lorenzo","family":"Giannini","sequence":"first","affiliation":[{"name":"Sapienza University of Rome,Department of Information Engineering, Electronics and Telecommunications,Rome,Italy"}]},{"given":"Alessio","family":"Buzzin","sequence":"additional","affiliation":[{"name":"Sapienza University of Rome,Department of Information Engineering, Electronics and Telecommunications,Rome,Italy"}]},{"given":"Riccardo","family":"Simonetti","sequence":"additional","affiliation":[{"name":"Sapienza University of Rome,Department of Information Engineering, Electronics and Telecommunications,Rome,Italy"}]},{"given":"Rita","family":"Asquini","sequence":"additional","affiliation":[{"name":"Sapienza University of Rome,Department of Information Engineering, Electronics and Telecommunications,Rome,Italy"}]},{"given":"Nicola Pio","family":"Belfiore","sequence":"additional","affiliation":[{"name":"Roma Tre University,Department of Industrial, Electronic and Mechanical Engineering,Rome,Italy"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.3390\/act7040085"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/OJNANO.2021.3050496"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1038\/s42254-018-0001-7"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s11340-007-9099-8"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.2174\/2212797611306020005"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/OJEMB.2024.3351717"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.3390\/mi10070436"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/CoASE.2015.7294332"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2021.113002"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1088\/0960-1317\/15\/7\/022"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.5772\/59677"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/s00542-013-1737-8"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.3390\/act11030071"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1088\/0960-1317\/18\/5\/055013"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2019.07.007"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JMEMS.2009.2016275"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1088\/1748-6041\/2\/1\/S03"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/NEMS.2010.5592177"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6439\/aaaf31"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.3390\/mi14122229"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1038\/s41378-021-00336-0"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1117\/1.2198532"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JMEMS.2015.2388539"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1117\/1.2198532"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/MIPRO60963.2024.10569653"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/s00542-018-04292-0"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1115\/1.4035053"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/JMEMS.2017.2696033"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1088\/2053-1591\/ab2423"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1063\/1.3474652"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/JMEMS.2006.885853"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ICM.2008.5393544"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2010.12.003"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1115\/1.4038010"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2024.115800"},{"issue":"20","key":"ref36","volume-title":"Properties of Crystalline Silicon.","author":"Hull","year":"1999"}],"event":{"name":"2025 10th International Workshop on Advances in Sensors and Interfaces (IWASI)","start":{"date-parts":[[2025,7,3]]},"location":"Manfredonia, Italy","end":{"date-parts":[[2025,7,4]]}},"container-title":["2025 10th International Workshop on Advances in Sensors and Interfaces (IWASI)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11121939\/11121929\/11121994.pdf?arnumber=11121994","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,20]],"date-time":"2025-08-20T06:27:27Z","timestamp":1755671247000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11121994\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,7,3]]},"references-count":36,"URL":"https:\/\/doi.org\/10.1109\/iwasi66786.2025.11121994","relation":{},"subject":[],"published":{"date-parts":[[2025,7,3]]}}}