{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,3]],"date-time":"2026-04-03T15:33:04Z","timestamp":1775230384755,"version":"3.50.1"},"reference-count":0,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE\/CAA J. Autom. Sinica"],"published-print":{"date-parts":[[2017,4]]},"DOI":"10.1109\/jas.2017.7510496","type":"journal-article","created":{"date-parts":[[2017,4,7]],"date-time":"2017-04-07T18:33:20Z","timestamp":1491590000000},"page":"177-185","source":"Crossref","is-referenced-by-count":32,"title":["Multilevel feature moving average ratio method for fault diagnosis of the microgrid inverter switch"],"prefix":"10.1109","volume":"4","author":[{"given":"Zhanjun","family":"Huang","sequence":"first","affiliation":[{"name":"College of Information Science and Engineering, Northeastern University, Shenyang 110819, China, and also with the State Key Laboratory of Synthetical Automation for Process Industries, Shenyang 110819, China"}]},{"given":"Zhanshan","family":"Wang","sequence":"additional","affiliation":[{"name":"College of Information Science and Engineering, Northeastern University, Shenyang 110819, China, and also with the State Key Laboratory of Synthetical Automation for Process Industries, Shenyang 110819, China"}]},{"given":"Huaguang","family":"Zhang","sequence":"additional","affiliation":[{"name":"College of Information Science and Engineering, Northeastern University, Shenyang 110819, China, and also with the State Key Laboratory of Synthetical Automation for Process Industries, Shenyang 110819, China"}]}],"member":"263","container-title":["IEEE\/CAA Journal of Automatica Sinica"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6570654\/7894123\/07894128.pdf?arnumber=7894128","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,27]],"date-time":"2024-02-27T19:27:14Z","timestamp":1709062034000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/7894128\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,4]]},"references-count":0,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/jas.2017.7510496","relation":{},"ISSN":["2329-9266","2329-9274"],"issn-type":[{"value":"2329-9266","type":"print"},{"value":"2329-9274","type":"electronic"}],"subject":[],"published":{"date-parts":[[2017,4]]}}}