{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,23]],"date-time":"2026-06-23T04:35:03Z","timestamp":1782189303826,"version":"3.54.5"},"reference-count":25,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2015,6,1]],"date-time":"2015-06-01T00:00:00Z","timestamp":1433116800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Emerg. Sel. Topics Circuits Syst."],"published-print":{"date-parts":[[2015,6]]},"DOI":"10.1109\/jetcas.2015.2426492","type":"journal-article","created":{"date-parts":[[2015,5,1]],"date-time":"2015-05-01T18:44:56Z","timestamp":1430505896000},"page":"214-221","source":"Crossref","is-referenced-by-count":133,"title":["True Random Number Generation by Variability of Resistive Switching in Oxide-Based Devices"],"prefix":"10.1109","volume":"5","author":[{"given":"Simone","family":"Balatti","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Stefano","family":"Ambrogio","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zhongqiang","family":"Wang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Daniele","family":"Ielmini","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2014.7047051"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2014.2330200"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2013.2261451"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2012.2184545"},{"key":"ref14","first-page":"1","article-title":"Intrinsic switching behavior in <formula formulatype=\"inline\"><tex Notation=\"TeX\">${\\rm HfO}_{2}$<\/tex><\/formula> RRAM by fast electrical measurements on novel 2R test structures","author":"fantini","year":"2012","journal-title":"Proc Int Memory Workshop"},{"key":"ref15","first-page":"186","article-title":"Stochastic learning in oxide binary synaptic device for neuromorphic computing","volume":"7","author":"yu","year":"2015","journal-title":"Front Neurosci"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2008.4796677"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1063\/1.2959065"},{"key":"ref18","doi-asserted-by":"crossref","first-page":"1951","DOI":"10.1109\/JPROC.2012.2190369","article-title":"Metal?Oxide RRAM","volume":"100","author":"philip wong","year":"2012","journal-title":"Proc IEEE"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2011.2167513"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.7567\/APEX.7.083001"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2012.2199734"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2014.6865703"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1039\/c3nr01176c"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2012.6479013"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1063\/1.3304167"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2006.1696222"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2014.2330202"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MSPEC.2011.5995897"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2012.2202319"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/22\/25\/254022"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2012.2202320"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/23\/21\/215202"},{"key":"ref23","first-page":"359","article-title":"Pulsed cycling operation and endurance failure of metal-oxide resistive RAM","author":"balatti","year":"2014","journal-title":"IEDM Tech Dig"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2010.11.031"}],"container-title":["IEEE Journal on Emerging and Selected Topics in Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/5503868\/7120202\/07100946.pdf?arnumber=7100946","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:01:47Z","timestamp":1642003307000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7100946\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,6]]},"references-count":25,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/jetcas.2015.2426492","relation":{},"ISSN":["2156-3357","2156-3365"],"issn-type":[{"value":"2156-3357","type":"print"},{"value":"2156-3365","type":"electronic"}],"subject":[],"published":{"date-parts":[[2015,6]]}}}