{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,14]],"date-time":"2026-03-14T18:24:39Z","timestamp":1773512679301,"version":"3.50.1"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2017,9,1]],"date-time":"2017-09-01T00:00:00Z","timestamp":1504224000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Emerg. Sel. Topics Circuits Syst."],"published-print":{"date-parts":[[2017,9]]},"DOI":"10.1109\/jetcas.2017.2649598","type":"journal-article","created":{"date-parts":[[2017,1,25]],"date-time":"2017-01-25T19:36:55Z","timestamp":1485373015000},"page":"413-421","source":"Crossref","is-referenced-by-count":43,"title":["Analysis of Dynamical Robustness to Noise in Power Grids"],"prefix":"10.1109","volume":"7","author":[{"given":"Lucia Valentina","family":"Gambuzza","sequence":"first","affiliation":[]},{"given":"Arturo","family":"Buscarino","sequence":"additional","affiliation":[]},{"given":"Luigi","family":"Fortuna","sequence":"additional","affiliation":[]},{"given":"Maurizio","family":"Porfiri","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4361-0576","authenticated-orcid":false,"given":"Mattia","family":"Frasca","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1038\/ncomms10790"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.physa.2013.01.023"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/HICSS.2010.398"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1088\/1367-2630\/17\/1\/015012"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1038\/nphys2535"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPAS.1981.316883"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1140\/epjb\/e2008-00098-8"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.physrep.2008.09.002"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.109.064101"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1140\/epjb\/e2012-30209-9"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2005.846178"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.physa.2009.09.039"},{"key":"ref27","author":"grainger","year":"1994","journal-title":"Power System Analysis"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1063\/1.3077229"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1137\/110851584"},{"key":"ref29","author":"christie","year":"2016","journal-title":"IEEE Power Systems Test Case Archive"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.3390\/en8099211"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1038\/ncomms4969"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1073\/pnas.1212134110"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevE.69.045104"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1088\/1367-2630\/16\/11\/115011"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevE.66.065102"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1142\/S0217979212460113"},{"key":"ref22","doi-asserted-by":"crossref","first-page":"3694","DOI":"10.1038\/srep03694","article-title":"Abruptness of cascade failures in power grids","volume":"4","author":"pahwa","year":"2014","journal-title":"Sci Rep"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevE.69.025103"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1985.13366"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.93.098701"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1038\/srep02026"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/5.481632"}],"container-title":["IEEE Journal on Emerging and Selected Topics in Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/5503868\/8027214\/07833053.pdf?arnumber=7833053","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:05:09Z","timestamp":1642003509000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7833053\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,9]]},"references-count":29,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/jetcas.2017.2649598","relation":{},"ISSN":["2156-3357","2156-3365"],"issn-type":[{"value":"2156-3357","type":"print"},{"value":"2156-3365","type":"electronic"}],"subject":[],"published":{"date-parts":[[2017,9]]}}}