{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,24]],"date-time":"2025-08-24T01:27:57Z","timestamp":1755998877014,"version":"3.37.3"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000161","name":"National Institute of Standards and Technology","doi-asserted-by":"publisher","award":["70NANB22H018"],"award-info":[{"award-number":["70NANB22H018"]}],"id":[{"id":"10.13039\/100000161","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100004696","name":"Western Digital","doi-asserted-by":"publisher","award":["ECNS21932N"],"award-info":[{"award-number":["ECNS21932N"]}],"id":[{"id":"10.13039\/100004696","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100007108","name":"George Washington University (GW) Cross-Disciplinary Research Fund","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100007108","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Emerg. Sel. Topics Circuits Syst."],"published-print":{"date-parts":[[2023,3]]},"DOI":"10.1109\/jetcas.2023.3238295","type":"journal-article","created":{"date-parts":[[2023,1,20]],"date-time":"2023-01-20T18:45:47Z","timestamp":1674240347000},"page":"382-394","source":"Crossref","is-referenced-by-count":4,"title":["Device Modeling Bias in ReRAM-Based Neural Network Simulations"],"prefix":"10.1109","volume":"13","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-7123-3982","authenticated-orcid":false,"given":"Osama","family":"Yousuf","sequence":"first","affiliation":[{"name":"Electrical and Computer Engineering Department, George Washington University, Washington, DC, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2931-0518","authenticated-orcid":false,"given":"Imtiaz","family":"Hossen","sequence":"additional","affiliation":[{"name":"Electrical and Computer Engineering Department, George Washington University, Washington, DC, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3390-4714","authenticated-orcid":false,"given":"Matthew W.","family":"Daniels","sequence":"additional","affiliation":[{"name":"National Institute of Standards and Technology, Gaithersburg, MD, USA"}]},{"given":"Martin","family":"Lueker-Boden","sequence":"additional","affiliation":[{"name":"Western Digital Technologies, San Jose, CA, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5461-8741","authenticated-orcid":false,"given":"Andrew","family":"Dienstfrey","sequence":"additional","affiliation":[{"name":"National Institute of Standards and Technology, Boulder, CO, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0027-1145","authenticated-orcid":false,"given":"Gina C.","family":"Adam","sequence":"additional","affiliation":[{"name":"Electrical and Computer Engineering Department, George Washington University, Washington, DC, USA"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-09766-4_499"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/3453688.3461746"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/mssc.2019.2922889"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2019.2961505"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201705914"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/isscc19947.2020.9063078"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-019-0270-x"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/iedm19573.2019.8993431"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/s10825-017-1051-2"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6463\/ab7bb6"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s10825-020-01537-y"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1063\/1.4979915"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2020.3018502"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ijcnn.2013.6706773"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1063\/1.3671565"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/22\/25\/254022"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1088\/0268-1242\/31\/11\/115013"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/essderc.2016.7599680"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/jetcas.2018.2796379"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/3477145.3477260"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2015.2439635"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/3292500.3330701"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1145\/3354265.3354266"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1007\/s10825-017-1107-3"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2019.2918102"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.3758\/s13414-019-01788-3"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-022-09556-4"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-020-00523-3"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-022-30539-6"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1145\/3407197.3407208"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1039\/c8fd00106e"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.3389\/fnins.2016.00333"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/msp.2012.2211477"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.3389\/fnins.2021.749811"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2020.3031627"},{"key":"ref36","first-page":"1737","article-title":"Deep learning with limited numerical precision","volume-title":"Proc. 32nd Int. Conf. Mach. Learn.","author":"Gupta"},{"key":"ref37","article-title":"PyTorch: An imperative style, high-performance deep learning library","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","volume":"32","author":"Paszke"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1364\/optica.5.001623"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1080\/03610928908830127"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1093\/mnras\/202.3.615"}],"container-title":["IEEE Journal on Emerging and Selected Topics in Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/5503868\/10078357\/10024104.pdf?arnumber=10024104","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,13]],"date-time":"2024-02-13T08:46:41Z","timestamp":1707814001000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10024104\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,3]]},"references-count":40,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/jetcas.2023.3238295","relation":{},"ISSN":["2156-3357","2156-3365"],"issn-type":[{"type":"print","value":"2156-3357"},{"type":"electronic","value":"2156-3365"}],"subject":[],"published":{"date-parts":[[2023,3]]}}}