{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T02:28:25Z","timestamp":1781836105656,"version":"3.54.5"},"reference-count":48,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T00:00:00Z","timestamp":1756684800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T00:00:00Z","timestamp":1756684800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T00:00:00Z","timestamp":1756684800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000006","name":"Office of Naval Research through the Project Security Verification of Heterogeneous Integrated Systems","doi-asserted-by":"publisher","award":["N000142212560"],"award-info":[{"award-number":["N000142212560"]}],"id":[{"id":"10.13039\/100000006","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Optimized System Design for Assurance and Life-cycle Management","award":["N000142412087"],"award-info":[{"award-number":["N000142412087"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Emerg. Sel. Topics Circuits Syst."],"published-print":{"date-parts":[[2025,9]]},"DOI":"10.1109\/jetcas.2025.3594675","type":"journal-article","created":{"date-parts":[[2025,8,1]],"date-time":"2025-08-01T18:15:14Z","timestamp":1754072114000},"page":"478-492","source":"Crossref","is-referenced-by-count":2,"title":["SAFET-HI: Secure Authentication-Based Framework for Encrypted Testing in Heterogeneous Integration"],"prefix":"10.1109","volume":"15","author":[{"ORCID":"https:\/\/orcid.org\/0009-0008-1349-3234","authenticated-orcid":false,"given":"Galib Ibne","family":"Haidar","sequence":"first","affiliation":[{"name":"Electrical and Computer Engineering, University of Florida, Gainesville, FL, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jingbo","family":"Zhou","sequence":"additional","affiliation":[{"name":"Electrical and Computer Engineering, University of Florida, Gainesville, FL, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3064-0741","authenticated-orcid":false,"given":"Md","family":"Sami Ul Islam Sami","sequence":"additional","affiliation":[{"name":"Electrical and Computer Engineering, University of Florida, Gainesville, FL, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Mark M.","family":"Tehranipoor","sequence":"additional","affiliation":[{"name":"Electrical and Computer Engineering, University of Florida, Gainesville, FL, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1535-0938","authenticated-orcid":false,"given":"Farimah","family":"Farahmandi","sequence":"additional","affiliation":[{"name":"Electrical and Computer Engineering, University of Florida, Gainesville, FL, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ieeestd.2020.9036129"},{"key":"ref2","volume-title":"Heterogeneous Integrated Product Testability Best-known Methods (BKM)","year":"2021"},{"key":"ref3","volume-title":"Test Challenges Directions As the Industry Moves to 3D Heterogeneous Products","author":"Nigh","year":"2021"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2016.2624282"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1002\/9783527697052.ch11"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2020.3020777"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2024.3368152"},{"key":"ref8","volume-title":"Defense Industrial Base Assessment: Counterfeit Electronics"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS45731.2020.9180407"},{"key":"ref10","volume-title":"National Defence Industrial Strategy","year":"2023"},{"key":"ref11","volume-title":"The U.S. Defense Industrial Base: Background and Issues for Congress","year":"2023"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2021.3059271"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICEICE.2017.8192439"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2018.8624085"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2017.20"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/INOCON57975.2023.10101289"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TCAPT.2007.906050"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ITC50571.2021.00025"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2024.3416865"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/3444960"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ETS54262.2022.9810399"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2018.8368642"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2023.3248269"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/HOST49136.2021.9702285"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2013.6653606"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/NATW.2014.17"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ITC51657.2024.00051"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/isvlsi61997.2024.00075"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1145\/3649329.3656527"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2024.3375874"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/3dic.2013.6702323"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ETS48528.2020.9131571"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ETS61313.2024.10567195"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2012.2227257"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2019.2928493"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/UEMCON59035.2023.10315970"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/SiPS47522.2019.9020320"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1145\/3625823"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1155\/2019\/2545123"},{"key":"ref40","article-title":"Acorn: A lightweight authenticated cipher","author":"Wu","year":"2016"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.3390\/electronics12143154"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/IMCOM60618.2024.10418285"},{"key":"ref43","first-page":"1","article-title":"Chiplets: How small is too small?","volume-title":"Proc. 60th ACM\/IEEE Design Autom. Conf. (DAC)","author":"Graening"},{"key":"ref44","volume-title":"V93000 Exa Scale\u2014The New Generation","year":"2025"},{"key":"ref45","volume-title":"Ultraflexplus\u2014The World\u2019s Leading Semiconductor Test Platform","year":"2025"},{"key":"ref46","first-page":"1","article-title":"Architecture, chip, and package co-design flow for 2.5D IC design enabling heterogeneous IP reuse","volume-title":"Proc. 56th Annu. Design Autom. Conf.","author":"Kim"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1145\/3464959"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3080257"}],"container-title":["IEEE Journal on Emerging and Selected Topics in Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/5503868\/11164456\/11106505.pdf?arnumber=11106505","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,9,16]],"date-time":"2025-09-16T17:34:37Z","timestamp":1758044077000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11106505\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,9]]},"references-count":48,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/jetcas.2025.3594675","relation":{},"ISSN":["2156-3357","2156-3365"],"issn-type":[{"value":"2156-3357","type":"print"},{"value":"2156-3365","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,9]]}}}