{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,3]],"date-time":"2026-06-03T16:00:45Z","timestamp":1780502445021,"version":"3.54.1"},"reference-count":38,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"16","license":[{"start":{"date-parts":[[2024,8,15]],"date-time":"2024-08-15T00:00:00Z","timestamp":1723680000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,8,15]],"date-time":"2024-08-15T00:00:00Z","timestamp":1723680000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,8,15]],"date-time":"2024-08-15T00:00:00Z","timestamp":1723680000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100003725","name":"National Research Foundation of Korea funded by the Korean Government Ministry of Science and Information and Communications Technology","doi-asserted-by":"publisher","award":["2020M3F3A2A01081918"],"award-info":[{"award-number":["2020M3F3A2A01081918"]}],"id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Institute of Information and Communications Technology Planning and Evaluation (IITP) Grant funded by the Korea Government","award":["RS-2023-00229028"],"award-info":[{"award-number":["RS-2023-00229028"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Internet Things J."],"published-print":{"date-parts":[[2024,8,15]]},"DOI":"10.1109\/jiot.2024.3399482","type":"journal-article","created":{"date-parts":[[2024,5,10]],"date-time":"2024-05-10T17:27:44Z","timestamp":1715362064000},"page":"27676-27686","source":"Crossref","is-referenced-by-count":7,"title":["Design of Physically Unclonable Function Using Ferroelectric FET With Auto Write-Back Technique for Resource-Limited IoT Security"],"prefix":"10.1109","volume":"11","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-4772-2695","authenticated-orcid":false,"given":"Sehee","family":"Lim","sequence":"first","affiliation":[{"name":"School of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2026-2097","authenticated-orcid":false,"given":"Junghyeon","family":"Hwang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9028-4603","authenticated-orcid":false,"given":"Dong Han","family":"Ko","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5927-9390","authenticated-orcid":false,"given":"Se Keon","family":"Kim","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7545-2429","authenticated-orcid":false,"given":"Tae Woo","family":"Oh","sequence":"additional","affiliation":[{"name":"Memory Division, DRAM Design Team, Samsung Electronics, Hwaseong, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4222-1587","authenticated-orcid":false,"given":"Sanghun","family":"Jeon","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0757-2581","authenticated-orcid":false,"given":"Seong-Ook","family":"Jung","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2014.7001385"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4614-5040-5"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1126\/science.1074376"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2018.2838580"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.3390\/s19143208"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2022.3206214"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2020.2976623"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2021.3067173"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3050295"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2022.3168133"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC55480.2022.9911355"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2023.3265667"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2015.7168920"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3111913"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3061721"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-020-00492-7"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2022.3222383"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2011.6131532"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2020.2969401"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2018.2856818"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/978-94-024-0841-6"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.2996772"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-23951-9_24"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2021.3100290"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2021.3087335"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS45951.2020.9128323"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.23919\/VLSIT.2019.8776497"},{"key":"ref28","volume-title":"Predictive Technology Model (PTM)","year":"2021"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.1997.623738"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2018.8510622"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2018.2829122"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/iedm.2016.7838397"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2019.2930749"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.6028\/nist.sp.800-22r1a"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/isicir.2014.7029528"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.23919\/VLSITechnologyandCir57934.2023.10185261"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2020.3040425"},{"key":"ref38","first-page":"44","article-title":"Near threshold computing: Overcoming performance degradation from aggressive voltage scaling","volume-title":"Proc. Workshop Energy-Efficient Design Conjunct. ISCA","author":"Dreslinski"}],"container-title":["IEEE Internet of Things Journal"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6488907\/10623554\/10529176.pdf?arnumber=10529176","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,8,6]],"date-time":"2024-08-06T10:11:17Z","timestamp":1722939077000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10529176\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,8,15]]},"references-count":38,"journal-issue":{"issue":"16"},"URL":"https:\/\/doi.org\/10.1109\/jiot.2024.3399482","relation":{},"ISSN":["2327-4662","2372-2541"],"issn-type":[{"value":"2327-4662","type":"electronic"},{"value":"2372-2541","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,8,15]]}}}