{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,26]],"date-time":"2026-03-26T15:30:11Z","timestamp":1774539011096,"version":"3.50.1"},"reference-count":27,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2025,4,1]],"date-time":"2025-04-01T00:00:00Z","timestamp":1743465600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,4,1]],"date-time":"2025-04-01T00:00:00Z","timestamp":1743465600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,4,1]],"date-time":"2025-04-01T00:00:00Z","timestamp":1743465600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2023YFC2414600"],"award-info":[{"award-number":["2023YFC2414600"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2023YFC2414603"],"award-info":[{"award-number":["2023YFC2414603"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Internet Things J."],"published-print":{"date-parts":[[2025,4,1]]},"DOI":"10.1109\/jiot.2024.3501298","type":"journal-article","created":{"date-parts":[[2024,11,18]],"date-time":"2024-11-18T18:58:41Z","timestamp":1731956321000},"page":"8084-8094","source":"Crossref","is-referenced-by-count":8,"title":["Prognosis for Filament Degradation of X-Ray Tubes Based on IoMT Time Series Data"],"prefix":"10.1109","volume":"12","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-9189-7439","authenticated-orcid":false,"given":"Jie","family":"Zhong","sequence":"first","affiliation":[{"name":"College of Electrical Engineering, Sichuan University, Chengdu, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7159-9725","authenticated-orcid":false,"given":"Heng","family":"Zhang","sequence":"additional","affiliation":[{"name":"College of Electrical Engineering, Sichuan University, Chengdu, China"}]},{"given":"Qilin","family":"Liu","sequence":"additional","affiliation":[{"name":"Department of Urology, Innovation Institute for Integration of Medicine and Engineering, West China Hospital, Chengdu, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8879-7266","authenticated-orcid":false,"given":"Qiang","family":"Miao","sequence":"additional","affiliation":[{"name":"College of Electrical Engineering, Sichuan University, Chengdu, China"}]},{"given":"Jin","family":"Huang","sequence":"additional","affiliation":[{"name":"Department of Urology, Innovation Institute for Integration of Medicine and Engineering, West China Hospital, Chengdu, China"}]}],"member":"263","reference":[{"issue":"1","key":"ref1","article-title":"Cost-effectiveness of life cycle cost theory-based large medical equipment","volume":"2023","author":"Chang","year":"2022","journal-title":"Appl. Bion. Biomech."},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1002\/jcsm.13310"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1093\/neuonc\/noad012"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.radphyschem.2024.111880"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1201\/9781003095408"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/1712\/1\/012036"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-13-3705-5_21"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/24\/8\/085201"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IVNC.2015.7225577"},{"issue":"2","key":"ref10","first-page":"210","article-title":"Effect of the performance of insulating elements on the reliability of high-voltage vacuum devices","volume":"41","author":"Bochkov","year":"1998","journal-title":"Instrum. Exp. Tech."},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2023.113098"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2023.109315"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2024.3358871"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2024.3363610"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2024.111443"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijhydene.2022.12.005"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.energy.2023.129681"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.3390\/app112210588"},{"key":"ref19","article-title":"Modeling the filament condition for failure prediction of a filament in an X-ray tube","author":"Ma","year":"2016"},{"key":"ref20","volume-title":"Methods and systems for predicting failures in X-ray tubes","author":"Xu","year":"2020"},{"key":"ref21","volume-title":"X-ray tube with warning device for accurately indicating impending failure of the thermionic emitter","author":"Fuchs","year":"2002"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2023.3296595"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2022.3176300"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00745"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-45438-7_9"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.energy.2023.128575"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.envsoft.2022.105581"}],"container-title":["IEEE Internet of Things Journal"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6488907\/10939020\/10756568.pdf?arnumber=10756568","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,29]],"date-time":"2025-03-29T04:07:23Z","timestamp":1743221243000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10756568\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,4,1]]},"references-count":27,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/jiot.2024.3501298","relation":{},"ISSN":["2327-4662","2372-2541"],"issn-type":[{"value":"2327-4662","type":"electronic"},{"value":"2372-2541","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,4,1]]}}}