{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,18]],"date-time":"2026-03-18T13:23:46Z","timestamp":1773840226042,"version":"3.50.1"},"reference-count":68,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2025,1,15]],"date-time":"2025-01-15T00:00:00Z","timestamp":1736899200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,15]],"date-time":"2025-01-15T00:00:00Z","timestamp":1736899200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,15]],"date-time":"2025-01-15T00:00:00Z","timestamp":1736899200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"National Key Research and Development Program of China","award":["2023YFB2703600"],"award-info":[{"award-number":["2023YFB2703600"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62202510"],"award-info":[{"award-number":["62202510"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Major Key Project of PCL","award":["PCL2023A05"],"award-info":[{"award-number":["PCL2023A05"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Internet Things J."],"published-print":{"date-parts":[[2025,1,15]]},"DOI":"10.1109\/jiot.2024.3506976","type":"journal-article","created":{"date-parts":[[2024,11,27]],"date-time":"2024-11-27T19:43:22Z","timestamp":1732736602000},"page":"1590-1601","source":"Crossref","is-referenced-by-count":4,"title":["An Empirical Study of High-Risk Vulnerabilities in IoT Systems"],"prefix":"10.1109","volume":"12","author":[{"given":"Xiang","family":"Chen","sequence":"first","affiliation":[{"name":"School of Software Engineering, Sun Yat-sen University, Zhuhai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1352-7429","authenticated-orcid":false,"given":"Changlin","family":"Yang","sequence":"additional","affiliation":[{"name":"School of Software Engineering, Sun Yat-sen University, Zhuhai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9597-9888","authenticated-orcid":false,"given":"Yuhong","family":"Nan","sequence":"additional","affiliation":[{"name":"School of Software Engineering, Sun Yat-sen University, Zhuhai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7872-7718","authenticated-orcid":false,"given":"Zibin","family":"Zheng","sequence":"additional","affiliation":[{"name":"School of Software Engineering, Sun Yat-sen University, Zhuhai, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/COMST.2015.2444095"},{"key":"ref2","volume-title":"State of IoT 2023: Number of Connected IoT Devices Growing 16% to 16.7 Billion Globally","author":"Sinha","year":"2023"},{"key":"ref3","first-page":"1","article-title":"IoT technologies for embedded computing: A survey","volume-title":"Proc. 11th IEEE\/ACM\/IFIP Int. Conf. Hardw.\/Softw. Codesign Syst. Synth.","author":"Samie"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.4236\/ait.2016.62002"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.fcij.2017.02.001"},{"key":"ref6","volume-title":"Mirai (malware)\u2014Wikipedia, the free Encyclopedia.","year":"2024"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.5555\/3241189.3241275"},{"key":"ref8","volume-title":"BlueBorne (security vulnerability)\u2014Wikipedia, the free Encyclopedia.","year":"2024"},{"key":"ref9","volume-title":"Blueborne.","author":"Labs","year":"2024"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/3533767.3534366"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.3390\/s21072329"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2017.2707465"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/3379542"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/3333501"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.3390\/s18030817"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICEDSA.2016.7818534"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/COMST.2019.2910750"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/s41635-017-0029-7"},{"key":"ref19","volume-title":"National vulnerability database","year":"2024"},{"key":"ref20","volume-title":"Common vulnerabilities and exposures","year":"2024"},{"key":"ref21","volume-title":"Common weakness enumeration","year":"2024"},{"key":"ref22","volume-title":"Common vulnerability scoring system SIG","year":"2024"},{"key":"ref23","volume-title":"Common platform enumeration","year":"2024"},{"key":"ref24","volume-title":"Official Common Platform Enumeration (CPE) dictionary","year":"2024"},{"key":"ref25","volume-title":"CVE-2017-14315 detail","year":"2024"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE43902.2021.00051"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/MCE.2019.2953740"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1145\/3607199.3607241"},{"key":"ref29","volume-title":"Introduction to development with NVD data","year":"2024"},{"key":"ref30","volume-title":"An empirical study of high-risk vulnerabilities in IoT systems artifact package","year":"2024"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.iotcps.2022.12.003"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.3390\/s21134359"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1145\/3427228.3427257"},{"key":"ref34","volume-title":"2023 CWE top 25 methodology","year":"2024"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/32.799955"},{"key":"ref36","volume-title":"CWE-compatible products and services","year":"2024"},{"key":"ref37","volume-title":"CWE view: Research concepts.","year":"2024"},{"key":"ref38","volume-title":"Device categories of high-risk IoT vulnerabilities.","year":"2024"},{"key":"ref39","volume-title":"Astr\u00e9e: Fast and sound static analysis.","year":"2024"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-31987-0_3"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.6028\/NIST.IR.8304"},{"key":"ref42","volume-title":"CBMC: Bounded model checking for software.","year":"2024"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-54862-8_26"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.23919\/ICACT48636.2020.9061281"},{"key":"ref45","volume-title":"Codepeer: The Most Comprehensive Static Analysis Toolsuite for Ada","year":"2024"},{"key":"ref46","volume-title":"Codeql.","year":"2024"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1145\/3533767.3534380"},{"key":"ref48","volume-title":"Cppcheck.","year":"2024"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1016\/j.procs.2020.04.217"},{"key":"ref50","volume-title":"Cppdepend: The ultimate C\/C++ code quality analysis tool for professionals.","year":"2024"},{"key":"ref51","volume-title":"CWE checker.","year":"2024"},{"key":"ref52","volume-title":"Flawfinder","year":"2024"},{"key":"ref53","volume-title":"Frama-C: A platform to make your C code safer and more secure.","author":"Alberti","year":"2024"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1145\/3470569"},{"key":"ref55","volume-title":"Infer: A tool to detect bugs in Java and C\/C++\/objective-C code before it ships.","year":"2024"},{"key":"ref56","article-title":"Challenges of using sound and complete static code analysis tools in industrial software","author":"Stikkelorum","year":"2016"},{"key":"ref57","volume-title":"Sparkpro","year":"2024"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2020.2983983"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2015.08.002"},{"key":"ref60","volume-title":"Test suites.","year":"2024"},{"key":"ref61","doi-asserted-by":"publisher","DOI":"10.1145\/2590296.2590300"},{"key":"ref62","doi-asserted-by":"publisher","DOI":"10.1016\/j.cose.2021.102580"},{"key":"ref63","doi-asserted-by":"publisher","DOI":"10.1109\/SCORED.2015.7449345"},{"key":"ref64","doi-asserted-by":"publisher","DOI":"10.1145\/3540250.3549105"},{"key":"ref65","doi-asserted-by":"publisher","DOI":"10.1109\/MSR.2017.60"},{"key":"ref66","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2998043"},{"key":"ref67","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2019.2956690"},{"key":"ref68","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2020.2975176"}],"container-title":["IEEE Internet of Things Journal"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6488907\/10836656\/10769424.pdf?arnumber=10769424","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,11]],"date-time":"2025-01-11T10:33:37Z","timestamp":1736591617000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10769424\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,1,15]]},"references-count":68,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/jiot.2024.3506976","relation":{},"ISSN":["2327-4662","2372-2541"],"issn-type":[{"value":"2327-4662","type":"electronic"},{"value":"2372-2541","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,1,15]]}}}