{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,24]],"date-time":"2026-03-24T03:15:17Z","timestamp":1774322117152,"version":"3.50.1"},"reference-count":35,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2008,11,1]],"date-time":"2008-11-01T00:00:00Z","timestamp":1225497600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Proc. IEEE"],"published-print":{"date-parts":[[2008,11]]},"DOI":"10.1109\/jproc.2008.2007600","type":"journal-article","created":{"date-parts":[[2008,12,9]],"date-time":"2008-12-09T18:05:17Z","timestamp":1228845917000},"page":"1836-1846","source":"Crossref","is-referenced-by-count":51,"title":["Patterned Media: Nanofabrication Challenges of Future Disk Drives"],"prefix":"10.1109","volume":"96","author":[{"given":"E.A.","family":"Dobisz","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Z.Z.","family":"Bandic","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Tsai-Wei Wu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"T.","family":"Albrecht","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1116\/1.2357963"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1021\/nl051932+"},{"key":"ref31","article-title":"electron-beam mastering with fine beam and precise positioning for patterned disks","author":"nishida","year":"2006","journal-title":"Fall MRS Meeting"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1116\/1.2798711"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/84.679336"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1063\/1.2799174"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1098\/rsta.1948.0007"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2006.879572"},{"key":"ref12","year":"1999"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1063\/1.1773362"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1143\/JJAP.41.1632"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1063\/1.118577"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1063\/1.1571232"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2006.878392"},{"key":"ref18","year":"2007","journal-title":"International Technology Roadmap for Semiconductors"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1116\/1.588589"},{"key":"ref28","first-page":"144","author":"heidari","year":"2005","journal-title":"Proc IEEE Int Conf Microprocess Nanotechnol Conf"},{"key":"ref4","first-page":"993","volume":"25","author":"ho","year":"2001","journal-title":"IEEE Trans Magn"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1116\/1.2401612"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/20.477564"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/20.824422"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/S0167-9317(03)00093-5"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2007.911019"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1146\/annurev.matsci.30.1.611"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/20.809134"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.71.1641"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2002.1017762"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1063\/1.2162476"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1063\/1.1766071"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2004.838049"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1038\/nature00792"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1116\/1.588605"},{"key":"ref23","first-page":"cc-06","author":"kikitsu","year":"2003","journal-title":"Proc Intermag 2003"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1126\/science.1157626"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1116\/1.1324618"}],"container-title":["Proceedings of the IEEE"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5\/4694715\/04694027.pdf?arnumber=4694027","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,11,29]],"date-time":"2021-11-29T20:23:04Z","timestamp":1638217384000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4694027\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,11]]},"references-count":35,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/jproc.2008.2007600","relation":{},"ISSN":["0018-9219","1558-2256"],"issn-type":[{"value":"0018-9219","type":"print"},{"value":"1558-2256","type":"electronic"}],"subject":[],"published":{"date-parts":[[2008,11]]}}}