{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,10]],"date-time":"2026-07-10T16:23:01Z","timestamp":1783700581557,"version":"3.55.0"},"reference-count":99,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2014,8,1]],"date-time":"2014-08-01T00:00:00Z","timestamp":1406851200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/OAPA.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Proc. IEEE"],"published-print":{"date-parts":[[2014,8]]},"DOI":"10.1109\/jproc.2014.2332291","type":"journal-article","created":{"date-parts":[[2014,7,15]],"date-time":"2014-07-15T18:32:31Z","timestamp":1405449151000},"page":"1207-1228","source":"Crossref","is-referenced-by-count":503,"title":["Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain"],"prefix":"10.1109","volume":"102","author":[{"given":"Ujjwal","family":"Guin","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ke","family":"Huang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Daniel","family":"DiMase","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"John M.","family":"Carulli","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Mohammad","family":"Tehranipoor","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yiorgos","family":"Makris","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref39","year":"0","journal-title":"Acceptability of Electronic Components Distributed in the Open Market"},{"key":"ref38","year":"2011","journal-title":"Certification for counterfeit components avoidance program"},{"key":"ref33","year":"2009","journal-title":"Counterfeit Electronic Parts Avoidance Detection Mitigation and Disposition"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.7"},{"key":"ref31","author":"kessler","year":"2010","journal-title":"Faked Parts Detection"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/MTV.2013.28"},{"key":"ref37","year":"0","journal-title":"Test methods standard Counterfeit electronic parts"},{"key":"ref36","year":"0","journal-title":"Fraudulent\/counterfeit electronic parts Avoidance detection mitigation and disposition—authorized\/franchised distribution"},{"key":"ref35","year":"2012","journal-title":"Fraudulent\/counterfeit electronic parts Avoidance detection mitigation and disposition—Distributors counterfeit electronic parts Avoidance protocol distributors"},{"key":"ref34","year":"2011","journal-title":"Fraudulent\/counterfeit electronic parts Tool for risk assessment of distributors"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.4271\/2012-01-2104"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2013.2264063"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.201101760"},{"key":"ref20","first-page":"20:1","article-title":"Active hardware metering for intellectual property protection and security","author":"alkabani","year":"0","journal-title":"Proc Usenix Security Symp"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TCAPT.2007.906050"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2001.935558"},{"key":"ref24","author":"pappu","year":"2001","journal-title":"Physical one-way functions"},{"key":"ref23","first-page":"1137","article-title":"Anti-counterfeiting with hardware intrinsic security","author":"de leest","year":"0","journal-title":"Proc Design Autom Test Eur Conf"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1145\/2228360.2228486"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1145\/2593069.2593157"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/FOCS.1961.33"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.1962.5219384"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2008.61"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.263"},{"key":"ref57","first-page":"296","article-title":"Trojan detection using IC fingerprinting","author":"agrawal","year":"0","journal-title":"Proc IEEE Symp Security Privacy"},{"key":"ref56","year":"2010","journal-title":"HSPICE Users Guide"},{"key":"ref55","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4757-1904-8","author":"jolliffe","year":"1986","journal-title":"Principal Component Analysis"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.907232"},{"key":"ref53","year":"0","journal-title":"A functional test approach for counterfeit substandard and high risk microcircuit detection"},{"key":"ref52","year":"0","journal-title":"Retronix curve trace test capability"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4615-0215-9"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.237"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MSPEC.2006.1628506"},{"key":"ref6","year":"2012","journal-title":"Reports of counterfeit parts quadruple since 2009 challenging U S Defence Industry and National Security"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/6144.991192"},{"key":"ref8","year":"2013","journal-title":"Winning the battle against counterfeit semiconductor products"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1145\/320954.320957"},{"key":"ref7","article-title":"Counterfeit IC detection and challenges ahead","volume":"43","author":"guin","year":"2013","journal-title":"ACM SIGDA Newsletters"},{"key":"ref9","article-title":"Counterfeit parts infiltrate aerospace projects","author":"nevison","year":"2009","journal-title":"Industry Market Trends"},{"key":"ref46","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4613-1451-6","author":"mazumder","year":"1996","journal-title":"Testing and Testable Design of High-Density Random-Access Memories"},{"key":"ref45","author":"bushnell","year":"2000","journal-title":"Essentials of Electronic Testing for Digital Memory and Mixed-Signal VLSI Circuits"},{"key":"ref48","year":"2012","journal-title":"Test method standard Test methods for semiconductor devices"},{"key":"ref47","year":"2010","journal-title":"Test method standard microcircuits"},{"key":"ref42","article-title":"Time-domain THz spectroscopy for counterfeit IC detection","author":"chou","year":"0","journal-title":"Terahertz Physics Devices and Systems VII Advanced Applications in Industry and Defense"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1364\/OL.20.001716"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1993.470653"},{"key":"ref43","first-page":"108","article-title":"Parametric tests meet the challenge of high-density ICs","volume":"48","author":"nelson","year":"1975","journal-title":"Electronics"},{"key":"ref73","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.24"},{"key":"ref72","first-page":"76","article-title":"IC activation and user authentication for security-sensitive systems","author":"huang","year":"0","journal-title":"Proc IEEE Int Workshop Hardware-Oriented Security Trust"},{"key":"ref71","doi-asserted-by":"publisher","DOI":"10.1145\/1403375.1403631"},{"key":"ref70","first-page":"674","article-title":"Remote activation of ICS for piracy prevention and digital right management","author":"alkabani","year":"0","journal-title":"Proc IEEE\/ACM Int Conf Comput -Aided Design"},{"key":"ref76","doi-asserted-by":"publisher","DOI":"10.1145\/2228360.2228377"},{"key":"ref77","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4419-8080-9"},{"key":"ref74","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2028166"},{"key":"ref75","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2012.6176634"},{"key":"ref78","first-page":"1","article-title":"On the (im)possibility of obfuscating programs","author":"barak","year":"0","journal-title":"Proc 21st Annu Int Cryptol Conf"},{"key":"ref79","article-title":"Split manufacturing method for advanced semiconductor circuits","author":"jarvis","year":"2004"},{"key":"ref60","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2008.4681643"},{"key":"ref62","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-45496-9_7"},{"key":"ref61","doi-asserted-by":"publisher","DOI":"10.1109\/MSPEC.2007.323431"},{"key":"ref63","doi-asserted-by":"crossref","first-page":"9","DOI":"10.1145\/1278480.1278484","article-title":"physical unclonable functions for device authentication and secret key generation","author":"suh","year":"2007","journal-title":"2007 44th ACM\/IEEE Design Automation Conference DAC"},{"key":"ref64","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2008.4559053"},{"key":"ref65","first-page":"372","article-title":"IC identification circuit using device mismatch","author":"lofstrom","year":"0","journal-title":"Proc IEEE Int Solid-State Circuits Conf"},{"key":"ref66","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2004.1346548"},{"key":"ref67","first-page":"406","article-title":"A 1.6 pJ\/bit 96% stable chip-ID generating circuit using process variations","author":"su","year":"0","journal-title":"Proc IEEE Int Solid-State Circuits Conf"},{"key":"ref68","doi-asserted-by":"publisher","DOI":"10.1145\/1973009.1973110"},{"key":"ref2","year":"2010","journal-title":"Defense Industrial Base Assessment Counterfeit Electronics"},{"key":"ref69","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2008.4681649"},{"key":"ref1","year":"2012","journal-title":"Inquiry into Counterfeit Electronic Parts in the Department of Defence Supply Chain"},{"key":"ref95","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2011.5955011"},{"key":"ref94","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2008.212"},{"key":"ref93","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2007.179"},{"key":"ref92","doi-asserted-by":"publisher","DOI":"10.1109\/RFID.2008.4519377"},{"key":"ref91","doi-asserted-by":"crossref","first-page":"1200","DOI":"10.1109\/TVLSI.2005.859470","article-title":"Extracting secret keys from integrated circuits","volume":"13","author":"lim","year":"2005","journal-title":"IEEE Trans Very Large Scale Integr (VLSI) Syst"},{"key":"ref90","doi-asserted-by":"publisher","DOI":"10.1145\/586110.586132"},{"key":"ref98","year":"2013"},{"key":"ref99","year":"2012","journal-title":"Public comments—DNA authentication marking on items in FSC5962"},{"key":"ref96","first-page":"1459","article-title":"Characterization of the ring PUF","author":"chen","year":"0","journal-title":"Proc Design Autom Test Eur Conf Exhibit"},{"key":"ref97","year":"2012","journal-title":"DNA AUTHENTICATIon MARKING on ITEMS in FSC 5962"},{"key":"ref10","year":"2012","journal-title":"Top 5 Most Counterfeited Parts Represent A $169 Billion Potential Challenge for Global Semiconductor Market"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1986.4335327"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1584030"},{"key":"ref13","year":"2011","journal-title":"Counterfeit Parts Increasing Awareness and Developing Countermeasures"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-013-5428-2"},{"key":"ref15","article-title":"On selection of counterfeit IC detection methods","author":"guin","year":"0","journal-title":"Proc IEEE North Atlantic Test Workshop"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2012.6378191"},{"key":"ref82","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2013.6651879"},{"key":"ref17","first-page":"51","article-title":"Hardware Trojan detection using path delay fingerprint","author":"jin","year":"0","journal-title":"Proc IEEE Int Workshop Hardware-Oriented Security Trust"},{"key":"ref81","first-page":"709","article-title":"Security analysis of integrated circuit camouflaging","author":"rajendran","year":"0","journal-title":"Proc ACM Conf Comput Commun Security"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2012.6378192"},{"key":"ref84","doi-asserted-by":"publisher","DOI":"10.1109\/43.952740"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2013.6653606"},{"key":"ref83","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.1998.694985"},{"key":"ref80","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.261"},{"key":"ref89","first-page":"115","article-title":"RFID-tags for anti-counterfeiting","author":"tuyls","year":"0","journal-title":"Proc Cryptographers' Track RSA Conf"},{"key":"ref85","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2007.896914"},{"key":"ref86","doi-asserted-by":"publisher","DOI":"10.1109\/43.952741"},{"key":"ref87","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.882490"},{"key":"ref88","doi-asserted-by":"publisher","DOI":"10.1063\/1.2209532"}],"container-title":["Proceedings of the IEEE"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/5\/6860340\/06856206.pdf?arnumber=6856206","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:28:43Z","timestamp":1642004923000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6856206\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,8]]},"references-count":99,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/jproc.2014.2332291","relation":{},"ISSN":["0018-9219","1558-2256"],"issn-type":[{"value":"0018-9219","type":"print"},{"value":"1558-2256","type":"electronic"}],"subject":[],"published":{"date-parts":[[2014,8]]}}}