{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,3,29]],"date-time":"2022-03-29T12:54:12Z","timestamp":1648558452290},"reference-count":43,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2015,8,1]],"date-time":"2015-08-01T00:00:00Z","timestamp":1438387200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"name":"National Science Foundation","award":["ECCS-1128518"],"award-info":[{"award-number":["ECCS-1128518"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Proc. IEEE"],"published-print":{"date-parts":[[2015,8]]},"DOI":"10.1109\/jproc.2015.2448936","type":"journal-article","created":{"date-parts":[[2015,7,15]],"date-time":"2015-07-15T18:55:06Z","timestamp":1436986506000},"page":"1250-1273","source":"Crossref","is-referenced-by-count":2,"title":["Implications of Scales in Processing of Information"],"prefix":"10.1109","volume":"103","author":[{"given":"Sandip","family":"Tiwari","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2002.1012775"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/SOI.2003.1242941"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1063\/1.1722712"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-31479-0_10"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.76.174121"},{"key":"ref30","author":"feynman","year":"1964","journal-title":"The Feynman Lectures on Physics"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1063\/1.3494533"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1063\/1.1644917"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.102.045701"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRev.95.690"},{"key":"ref10","first-page":"733","article-title":"Comparison of raised and Schottky source\/drain MOSFETs using a novel tunneling contact model","author":"ieong","year":"0","journal-title":"Proc Int Electron Devices Meeting"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1145\/2564925"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2004.841344"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/3.135278"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1063\/1.2337104"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/EDL.1983.25635"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2010.2095821"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1143\/JJAP.31.L455"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/55.568773"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.1998.746462"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/DRC.2011.5994496"},{"key":"ref28","author":"bastard","year":"1988","journal-title":"Wave mechanics applied to semiconductor heterostructures"},{"key":"ref4","author":"kuo","year":"1999","journal-title":"Low-Voltage CMOS VLSI Circuits"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1103\/RevModPhys.66.217"},{"key":"ref3","author":"mead","year":"1980","journal-title":"Introduction to VLSI Design"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1038\/nphys537"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1134\/1.1130485"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1038\/nature05833"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1063\/1.2213966"},{"key":"ref7","author":"feynman","year":"0","journal-title":"Feynman Lectures on Computation"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2006.91"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1063\/1.112250"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1977.1050947"},{"key":"ref20","doi-asserted-by":"crossref","first-page":"405","DOI":"10.1021\/nl071804g","article-title":"Use of negative capacitance to provide voltage amplification for low power nanoscale devices","volume":"8","author":"salahuddin","year":"2008","journal-title":"Nano Lett"},{"key":"ref22","first-page":"2254","article-title":"Interface roughness and alloy-disorder scattering contributions to intersubband transition linewidths","volume":"69","author":"campan","year":"1996","journal-title":"Appl Phys Lett"},{"key":"ref21","first-page":"1","article-title":"Can the subthreshold swing in a classical FET be lowed below 60 mV\/decade?","author":"salahuddin","year":"2008","journal-title":"Proc Int Electron Devices Meeting"},{"key":"ref42","author":"bessiere","year":"2004","journal-title":"Bayesian Programming"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1063\/1.1535733"},{"key":"ref41","author":"ferri","year":"2004","journal-title":"Low-Voltage Low-Power CMOS Current Conveyors"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1088\/0268-1242\/8\/5\/019"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1103\/RevModPhys.61.917"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1111\/j.1365-2427.2009.02219.x"},{"key":"ref25","author":"eisenstein","year":"2004","journal-title":"Novel phenomena in double layer two-dimensional electron systems"}],"container-title":["Proceedings of the IEEE"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/5\/7158995\/07159149.pdf?arnumber=7159149","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:46:55Z","timestamp":1642006015000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7159149\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,8]]},"references-count":43,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/jproc.2015.2448936","relation":{},"ISSN":["0018-9219","1558-2256"],"issn-type":[{"value":"0018-9219","type":"print"},{"value":"1558-2256","type":"electronic"}],"subject":[],"published":{"date-parts":[[2015,8]]}}}