{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,31]],"date-time":"2026-03-31T14:27:19Z","timestamp":1774967239152,"version":"3.50.1"},"reference-count":64,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2016,10,1]],"date-time":"2016-10-01T00:00:00Z","timestamp":1475280000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Proc. IEEE"],"published-print":{"date-parts":[[2016,10]]},"DOI":"10.1109\/jproc.2016.2578303","type":"journal-article","created":{"date-parts":[[2016,9,12]],"date-time":"2016-09-12T14:06:53Z","timestamp":1473689213000},"page":"1894-1918","source":"Crossref","is-referenced-by-count":143,"title":["Spintronic Sensors"],"prefix":"10.1109","volume":"104","author":[{"given":"Paulo P.","family":"Freitas","sequence":"first","affiliation":[]},{"given":"Ricardo","family":"Ferreira","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6913-6529","authenticated-orcid":false,"given":"Susana","family":"Cardoso","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1021\/nl201108b"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1063\/1.3300717"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1063\/1.4859036"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1063\/1.123158"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1063\/1.3360583"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1142\/S2010324711000070"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201201898"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/20.908593"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/20.799086"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1063\/1.1452654"},{"key":"ref60","year":"0","journal-title":"MAGNOMICS | Nanotech for Life Sciences"},{"key":"ref62","doi-asserted-by":"publisher","DOI":"10.1109\/84.825780"},{"key":"ref61","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2245058"},{"key":"ref63","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2012.2198449"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1063\/1.2838626"},{"key":"ref64","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2012.2202381"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1038\/nmat2804"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1063\/1.3693585"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.physe.2004.10.012"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.89.130801"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1051\/epjap\/2015150214"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2003.821200"},{"key":"ref21","article-title":"Magnetoelectronics","author":"dieny","year":"2004","journal-title":"Spin Valves"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1063\/1.3226676"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2012.2202887"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2012.2200468"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1063\/1.3701277"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1063\/1.367861"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.3390\/s110302447"},{"key":"ref59","year":"0","journal-title":"Zepto Life Technology LLC"},{"key":"ref58","year":"0","journal-title":"MagArray Inc"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.3390\/s90604119"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1063\/1.1984090"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1016\/j.bios.2009.01.040"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2004.830626"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1039\/c1lc20791a"},{"key":"ref52","author":"ramirez","year":"2013","journal-title":"Dispositivo y sistema de medida analógica de potencia eléctrica por magnetorresistencia"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/0304-8853(91)90311-W"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/20.750647"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/INTMAG.2015.7156555"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/20.539099"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1063\/1.1702682"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/0375-9601(75)90174-7"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2004.830219"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1063\/1.2976435"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/s11433-012-4977-1"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/20.801044"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1088\/0953-8984\/19\/16\/165221"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/20.539099"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1063\/1.2172706"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmmm.2005.02.054"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2005.09.046"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.10.4626"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2013.2239274"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2012.2196422"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.61.2472"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2014.03.021"},{"key":"ref45","year":"0","journal-title":"Wuxi Lertech Co Ltd"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2011.04.044"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1063\/1.4864045"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/5.168666"},{"key":"ref41","year":"0","journal-title":"International Iberian Nanotechnology Laboratory"},{"key":"ref44","doi-asserted-by":"crossref","first-page":"2","DOI":"10.1117\/12.385014","article-title":"Low frequency electromagnetic technique for nondestructive evaluation","volume":"3994","author":"dalichaouch","year":"0","journal-title":"Proc SPIE"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/20.952754"}],"container-title":["Proceedings of the IEEE"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/5\/7571194\/07564473.pdf?arnumber=7564473","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T11:43:08Z","timestamp":1641987788000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/7564473\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,10]]},"references-count":64,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/jproc.2016.2578303","relation":{},"ISSN":["0018-9219","1558-2256"],"issn-type":[{"value":"0018-9219","type":"print"},{"value":"1558-2256","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016,10]]}}}