{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,9,13]],"date-time":"2023-09-13T16:32:19Z","timestamp":1694622739271},"reference-count":18,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[1986,1,1]],"date-time":"1986-01-01T00:00:00Z","timestamp":504921600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Select. Areas Commun."],"published-print":{"date-parts":[[1986,1]]},"DOI":"10.1109\/jsac.1986.1146297","type":"journal-article","created":{"date-parts":[[2004,4,29]],"date-time":"2004-04-29T00:28:59Z","timestamp":1083198539000},"page":"15-23","source":"Crossref","is-referenced-by-count":3,"title":["A Theory for the Design of Soft-Error-Tolerant VLSI Circuits"],"prefix":"10.1109","volume":"4","author":[{"given":"Y.","family":"Savaria","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.","family":"Hayes","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"N.","family":"Rumin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"V.","family":"Agarwal","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","first-page":"13","article-title":"Measurement of alpha-particle radioactivity in IC packets","author":"meiran","year":"1979","journal-title":"Proc Int Rel Phys Symp IEEE"},{"key":"ref11","author":"savaria","year":"1985","journal-title":"The Design of Digital Machines Tolerant to Soft Errors"},{"key":"ref12","author":"winograd","year":"1963","journal-title":"Reliable Computation in the Presence of Noise"},{"key":"ref13","first-page":"649","article-title":"A design for machines with built-in tolerance to soft errors","author":"savaria","year":"1984","journal-title":"Int Test Conf (ITC)"},{"key":"ref14","first-page":"1.2","article-title":"Delay equalization for soft-error tolerance of VLSI logic circuits","author":"savaria","year":"1984","journal-title":"Tech Digest of the 1984 Canadian Conf Very Large Scale Integration"},{"key":"ref15","first-page":"137","article-title":"High-performance MOS resists radiation","author":"davis","year":"1982","journal-title":"Electronics"},{"key":"ref16","volume":"1","year":"1982","journal-title":"The Reliability Handbook"},{"key":"ref17","first-page":"191","author":"wood","year":"1981","journal-title":"Reliability and Degradation of Semiconductor Devices and Circuits"},{"key":"ref18","doi-asserted-by":"crossref","first-page":"669","DOI":"10.1109\/PROC.1986.13530","article-title":"soft-error filtering: a solution to the reliability problem of future vlsi digital circuits","volume":"74","author":"savaria","year":"1986","journal-title":"Proceedings of the IEEE"},{"key":"ref4","author":"anderson","year":"1981","journal-title":"Fault Tolerance Principles and Practice"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MC.1984.1659217"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MC.1984.1659213"},{"key":"ref5","year":"1970","journal-title":"Error tolerant sequential circuits"},{"key":"ref8","first-page":"38","article-title":"Dynamics of charge collection from alpha-particle tracks in integrated circuits","author":"hsieh","year":"1981","journal-title":"IEEE Proc Int Rel Phys Symp"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1986.1052491"},{"key":"ref2","author":"siewiorek","year":"1982","journal-title":"The Theory and Practice of Reliable System Design"},{"key":"ref1","author":"savaria","year":"1984","journal-title":"Sources of soft errors and their effects on the reliability of computing machines"},{"key":"ref9","first-page":"33","article-title":"A new physical mechanism for soft errors in dynamic memories","author":"may","year":"1978","journal-title":"Proc Int Rel Phys Symp IEEE"}],"container-title":["IEEE Journal on Selected Areas in Communications"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx6\/49\/25818\/01146297.pdf?arnumber=1146297","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,11,29]],"date-time":"2021-11-29T20:25:57Z","timestamp":1638217557000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1146297\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1986,1]]},"references-count":18,"journal-issue":{"issue":"1","published-print":{"date-parts":[[1986,1]]}},"URL":"https:\/\/doi.org\/10.1109\/jsac.1986.1146297","relation":{},"ISSN":["0733-8716"],"issn-type":[{"value":"0733-8716","type":"print"}],"subject":[],"published":{"date-parts":[[1986,1]]}}}