{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,2,4]],"date-time":"2024-02-04T07:59:16Z","timestamp":1707033556514},"reference-count":26,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[1986,12,1]],"date-time":"1986-12-01T00:00:00Z","timestamp":533779200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Select. Areas Commun."],"published-print":{"date-parts":[[1986,12]]},"DOI":"10.1109\/jsac.1986.1146488","type":"journal-article","created":{"date-parts":[[2004,4,29]],"date-time":"2004-04-29T00:28:59Z","timestamp":1083198539000},"page":"1494-1501","source":"Crossref","is-referenced-by-count":5,"title":["High-Reliability Semiconductor Lasers for Optical Communications"],"prefix":"10.1109","volume":"4","author":[{"given":"M.","family":"Hirao","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K.","family":"Mizuishi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Nakamura","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref8a","doi-asserted-by":"publisher","DOI":"10.1109\/JQE.1983.1072019"},{"key":"ref8b","first-page":"359","volume":"21","year":"1982","journal-title":"Japan J Appl Phys"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1002\/j.1538-7305.1985.tb00448.x"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1002\/j.1538-7305.1985.tb00449.x"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1063\/1.93616"},{"key":"ref13","doi-asserted-by":"crossref","first-page":"2603","DOI":"10.1109\/T-ED.1985.22390","article-title":"reliability of semiconductor lasers for undersea optical transmission systems","volume":"32","author":"fujita","year":"1985","journal-title":"IEEE Transactions on Electron Devices"},{"key":"ref14","article-title":"InGaAsP\/InP laser diodes mounted on semi-insulating SiC ceramics","author":"tsuji","year":"1982","journal-title":"Tech Dig 14th Int Conf Solid State Devices"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1063\/1.333095"},{"key":"ref16","article-title":"Statistical lifetime prediction of 1.3-?m InGaAsP\/InP buried-heterostructure (BH) lasers","author":"mizuishi","year":"1983","journal-title":"Tech Dig 4th Int Conf Integrated Opt and Optical Fiber Commun (IOOC)"},{"key":"ref17","article-title":"Reliability of light sources","author":"ikegami","year":"1983","journal-title":"Tech Dig 4th Int Conf Integrated Opt and Optical Fiber Commun (IOOC)"},{"key":"ref18","first-page":"97","article-title":"Temperature-dependent lifetests of IRW lasers operating at 1.3 ?m","volume":"132","author":"rosiewicz","year":"1985","journal-title":"Proc IEEE"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1049\/el:19830279"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JLT.1983.1072079"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JQE.1981.1071153"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1143\/JJAP.19.L429"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JQE.1982.1071392"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1515\/JOC.1980.1.1.10"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1063\/1.328396"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JQE.1983.1072019"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JQE.1979.1070086"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1063\/1.330628"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1049\/el:19830197"},{"key":"ref21","article-title":"Improved screening method for long-life InGaAsP\/InP buried heterostructure (BH) lasers","author":"mizuishi","year":"1984","journal-title":"Tech Dig 9th IEEE Int Semiconductor Laser Conf"},{"key":"ref24","first-page":"39","article-title":"Stable cw operation of improved InGaAsP\/InP BC lasers at high temperatures","author":"higuchi","year":"1983","journal-title":"Tech Dig 9th ECOC"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JQE.1983.1071767"},{"key":"ref25","article-title":"TEM and IMA observation of thermal deformation of an InP surface corrugation","author":"nakamura","year":"1986","journal-title":"Int Symp Gallium Arsenide and Related Compounds"}],"container-title":["IEEE Journal on Selected Areas in Communications"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx6\/49\/25826\/01146488.pdf?arnumber=1146488","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,11,29]],"date-time":"2021-11-29T20:26:09Z","timestamp":1638217569000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1146488\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1986,12]]},"references-count":26,"journal-issue":{"issue":"9","published-print":{"date-parts":[[1986,12]]}},"URL":"https:\/\/doi.org\/10.1109\/jsac.1986.1146488","relation":{},"ISSN":["0733-8716"],"issn-type":[{"value":"0733-8716","type":"print"}],"subject":[],"published":{"date-parts":[[1986,12]]}}}