{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,9,13]],"date-time":"2023-09-13T19:24:59Z","timestamp":1694633099216},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2008,9,1]],"date-time":"2008-09-01T00:00:00Z","timestamp":1220227200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2008,9]]},"DOI":"10.1109\/jssc.2008.2001894","type":"journal-article","created":{"date-parts":[[2008,9,18]],"date-time":"2008-09-18T18:03:45Z","timestamp":1221761025000},"page":"2057-2066","source":"Crossref","is-referenced-by-count":14,"title":["A Methodology for Fast VSWR Protection Implemented in a Monolithic 3-W 55% PAE RF CMOS Power Amplifier"],"prefix":"10.1109","volume":"43","author":[{"given":"Francesco","family":"Carrara","sequence":"first","affiliation":[]},{"given":"Calogero D.","family":"Presti","sequence":"additional","affiliation":[]},{"given":"Antonino","family":"Scuderi","sequence":"additional","affiliation":[]},{"given":"Carmelo","family":"Santagati","sequence":"additional","affiliation":[]},{"given":"Giuseppe","family":"Palmisano","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2005.1493202"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2005.850639"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2003.814417"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.872734"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.877255"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC.2003.1213929"},{"key":"ref14","year":"2005","journal-title":"Multi cascode transistors"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2006.885634"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.843634"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1063\/1.2147714"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2007.373597"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2007.369873"},{"key":"ref28","first-page":"422","article-title":"rf s-parameter degradation under hot carrier stress","author":"walko","year":"2004","journal-title":"Proc 42nd Annu Int Reliability Phys Symp"},{"key":"ref4","first-page":"63","article-title":"cellular handset integrationsip vs. soc","author":"krenik","year":"2004","journal-title":"Proc IEEE Custom Integrated Circuits Conf (CICC)"},{"key":"ref27","author":"millman","year":"1987","journal-title":"Microelectronics"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2004.1332611"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.1997.606611"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2005.852546"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.1994.586252"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/4.982419"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/4.772411"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.857417"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/4.987090"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/35.783135"},{"key":"ref20","year":"2003","journal-title":"Method and apparatus for protecting radio frequency power amplifiers"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1049\/el:19710093"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.827799"},{"key":"ref24","year":"2007","journal-title":"A device for comparing the peak value of at least one voltage signal with a reference voltage"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/4.45015"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2007.377887"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/4.350192"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4\/4625985\/04626005.pdf?arnumber=4626005","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,11,29]],"date-time":"2021-11-29T20:28:23Z","timestamp":1638217703000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4626005\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,9]]},"references-count":31,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2008.2001894","relation":{},"ISSN":["0018-9200"],"issn-type":[{"value":"0018-9200","type":"print"}],"subject":[],"published":{"date-parts":[[2008,9]]}}}