{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,14]],"date-time":"2025-10-14T01:12:47Z","timestamp":1760404367992},"reference-count":15,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2009,1,1]],"date-time":"2009-01-01T00:00:00Z","timestamp":1230768000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2009,1]]},"DOI":"10.1109\/jssc.2008.2007448","type":"journal-article","created":{"date-parts":[[2009,1,14]],"date-time":"2009-01-14T19:01:43Z","timestamp":1231959703000},"page":"247-257","source":"Crossref","is-referenced-by-count":30,"title":["Ultra-Sensitive Capacitive Detection Based on SGMOSFET Compatible With Front-End CMOS Process"],"prefix":"10.1109","volume":"44","author":[{"given":"Eric","family":"Colinet","sequence":"first","affiliation":[],"role":[{"role":"author","vocab":"crossref"}]},{"given":"C\u00c9dric","family":"Durand","sequence":"additional","affiliation":[],"role":[{"role":"author","vocab":"crossref"}]},{"given":"Laurent","family":"Duraffourg","sequence":"additional","affiliation":[],"role":[{"role":"author","vocab":"crossref"}]},{"given":"Patrick","family":"Audebert","sequence":"additional","affiliation":[],"role":[{"role":"author","vocab":"crossref"}]},{"given":"Guillaume","family":"Dumas","sequence":"additional","affiliation":[],"role":[{"role":"author","vocab":"crossref"}]},{"given":"Fabrice","family":"Casset","sequence":"additional","affiliation":[],"role":[{"role":"author","vocab":"crossref"}]},{"given":"Eric","family":"Ollier","sequence":"additional","affiliation":[],"role":[{"role":"author","vocab":"crossref"}]},{"given":"Pascal","family":"Ancey","sequence":"additional","affiliation":[],"role":[{"role":"author","vocab":"crossref"}]},{"given":"Jean-Fran\u00c7ois","family":"Carpentier","sequence":"additional","affiliation":[],"role":[{"role":"author","vocab":"crossref"}]},{"given":"Lionel","family":"Buchaillot","sequence":"additional","affiliation":[],"role":[{"role":"author","vocab":"crossref"}]},{"given":"Adrian M.","family":"Ionescu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocab":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1063\/1.2918845"},{"key":"ref11","year":"0","journal-title":"MS3110 Capacitive Universal Readout IC"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1049\/el:20047409"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/MEMSYS.2008.4443831"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2008.919781"},{"key":"ref15","doi-asserted-by":"crossref","first-page":"41","DOI":"10.1111\/j.1460-2695.2006.01075.x","volume":"30","author":"george","year":"2006","journal-title":"Fatigue & Fracture of Engineering Materials and Structures"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JMEMS.2005.844845"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2006.873618"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2007.914085"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2007.892228"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/s00542-007-0485-z"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/NEMS.2007.352257"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1021\/nl0706695"},{"key":"ref1","doi-asserted-by":"crossref","DOI":"10.1201\/9781420036558","author":"gad-el-hak","year":"2005","journal-title":"The MEMS Handbook"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2007.911070"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4\/4735533\/04735549.pdf?arnumber=4735549","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,11,29]],"date-time":"2021-11-29T20:28:26Z","timestamp":1638217706000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4735549\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,1]]},"references-count":15,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2008.2007448","relation":{},"ISSN":["0018-9200"],"issn-type":[{"value":"0018-9200","type":"print"}],"subject":[],"published":{"date-parts":[[2009,1]]}}}