{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,29]],"date-time":"2025-09-29T11:56:20Z","timestamp":1759146980441},"reference-count":26,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2009,6,1]],"date-time":"2009-06-01T00:00:00Z","timestamp":1243814400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2009,6]]},"DOI":"10.1109\/jssc.2009.2020192","type":"journal-article","created":{"date-parts":[[2009,5,27]],"date-time":"2009-05-27T15:28:18Z","timestamp":1243438098000},"page":"1745-1755","source":"Crossref","is-referenced-by-count":34,"title":["All-Digital Ring-Oscillator-Based Macro for Sensing Dynamic Supply Noise Waveform"],"prefix":"10.1109","volume":"44","author":[{"given":"Yasuhiro","family":"Ogasahara","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Masanori","family":"Hashimoto","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Takao","family":"Onoye","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2006.229204"},{"key":"ref11","doi-asserted-by":"crossref","first-page":"162","DOI":"10.1145\/1278480.1278521","article-title":"on-chip decoupling capacitance and p\/g wire co-optimization for dynamic noise","author":"min zhao","year":"2007","journal-title":"2007 44th ACM\/IEEE Design Automation Conference DAC"},{"key":"ref12","first-page":"811","article-title":"efficient placement of distributed on-chip decoupling capacitors in nanoscale ics","author":"popovich","year":"2007","journal-title":"Proc IEEE\/ACM Int Conf CAD"},{"key":"ref13","first-page":"138","article-title":"application of on-chip samplers for test and measurement of integrated circuits","author":"ho","year":"1998","journal-title":"Symp VLSI Circuits Dig"},{"key":"ref14","first-page":"182","article-title":"an on-chip 100 ghz-sampling rate 8-channel sampling oscilloscope with embedded sampling clock generator","author":"takamiya","year":"2002","journal-title":"IEEE ISSCC Dig"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.825120"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2004.1346516"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2004.1346518"},{"key":"ref18","first-page":"240","article-title":"a sampling oscilloscope macro toward feedback physical design methodology","author":"takamiya","year":"2004","journal-title":"Symp VLSI Circuits Dig"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.845559"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2006.1705312"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/4.563679"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/369691.369734"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1997.597223"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/43.974140"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/369691.369737"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2001.968729"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2003.1218843"},{"key":"ref1","first-page":"735","article-title":"challenges in power-ground integrity","author":"lin","year":"2001","journal-title":"Proc IEEE\/ACM Int Conf CAD"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1093\/ietele\/e88-c.5.782"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2006.320990"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2006.320931"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2007.901574"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIR.2005.1541660"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2008.4483917"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2007.4405846"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4\/4982858\/04982874.pdf?arnumber=4982874","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:51:22Z","timestamp":1633909882000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4982874\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,6]]},"references-count":26,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2009.2020192","relation":{},"ISSN":["0018-9200"],"issn-type":[{"value":"0018-9200","type":"print"}],"subject":[],"published":{"date-parts":[[2009,6]]}}}