{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,4]],"date-time":"2026-06-04T15:43:44Z","timestamp":1780587824329,"version":"3.54.1"},"reference-count":32,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2009,11,1]],"date-time":"2009-11-01T00:00:00Z","timestamp":1257033600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2009,11]]},"DOI":"10.1109\/jssc.2009.2032698","type":"journal-article","created":{"date-parts":[[2009,11,12]],"date-time":"2009-11-12T20:42:43Z","timestamp":1258058563000},"page":"3174-3192","source":"Crossref","is-referenced-by-count":141,"title":["Large-Scale SRAM Variability Characterization in 45 nm CMOS"],"prefix":"10.1109","volume":"44","author":[{"given":"Zheng","family":"Guo","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Andrew","family":"Carlson","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Liang-Teck","family":"Pang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Kenneth T.","family":"Duong","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Tsu-Jae King","family":"Liu","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Borivoje","family":"Nikolic","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref32","first-page":"211","article-title":"a 45 nm dual-port sram with write and read capability enhancement at low voltage","author":"wang","year":"2007","journal-title":"Proc IEEE SOC"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.864124"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2008.4586011"},{"key":"ref10","first-page":"105","article-title":"finfet sram with enhanced read\/write margins","author":"carlson","year":"2006","journal-title":"IEEE Int SOI Conf"},{"key":"ref11","article-title":"6-t sram cell design with nanoscale double-gate soi mosfets: impact of source\/drain engineering and circuit topology","volume":"23","author":"rashmi","year":"2008","journal-title":"IOP Semiconductor Science and Technology"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IPFA.2002.1025622"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2004.1382599"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICMTS.2007.374463"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2008.4672107"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2022217"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2006.346880"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2006.1705227"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1117\/12.776889"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.859025"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2008.2004329"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639732"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2008.4585944"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2006.346883"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.4218\/etrij.07.0106.0298"},{"key":"ref5","first-page":"655","article-title":"erratic fluctuations of sram cache <ref_formula><tex notation=\"tex\">${\\rm v}_{\\rm min}$<\/tex><\/ref_formula> at the 90 nm process technology node","author":"agostinelli","year":"2005","journal-title":"IEDM Tech Dig"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/VTSA.2005.1497065"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1987.1052809"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.917506"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.883344"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2005.1609437"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2006.1696326"},{"key":"ref22","author":"chambers","year":"1983","journal-title":"Graphical Methods for Data Analysis"},{"key":"ref21","first-page":"229","article-title":"Impact of using adaptive body bias to compensate die-to-die Vt variation on within-die Vt variation","author":"narendra","year":"1999","journal-title":"Proceedings 1999 International Symposium on Low Power Electronics and Design (Cat No 99TH8477) LPE"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.827796"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2004.825195"},{"key":"ref26","first-page":"48","article-title":"pvt-variations and supply-noise tolerant 45 nm dense cache arrays with diffusion-notch-free (dnf) 6t sram cells and dynamic multi-vcc circuits","author":"khellah","year":"2008","journal-title":"VLSI Circuits Dig"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2006.1705290"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4\/5308580\/05308605.pdf?arnumber=5308605","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:52:36Z","timestamp":1633909956000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5308605\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,11]]},"references-count":32,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2009.2032698","relation":{},"ISSN":["0018-9200"],"issn-type":[{"value":"0018-9200","type":"print"}],"subject":[],"published":{"date-parts":[[2009,11]]}}}