{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,15]],"date-time":"2026-01-15T21:36:40Z","timestamp":1768513000091,"version":"3.49.0"},"reference-count":20,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2010,9,1]],"date-time":"2010-09-01T00:00:00Z","timestamp":1283299200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2010,9]]},"DOI":"10.1109\/jssc.2010.2053863","type":"journal-article","created":{"date-parts":[[2010,8,24]],"date-time":"2010-08-24T18:54:22Z","timestamp":1282676062000},"page":"1923-1934","source":"Crossref","is-referenced-by-count":28,"title":["An Integrated ISFETs Instrumentation System in Standard CMOS Technology"],"prefix":"10.1109","volume":"45","author":[{"given":"Wai Pan","family":"Chan","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bhusana","family":"Premanode","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Christofer","family":"Toumazou","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/16.678525"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/4.553171"},{"key":"ref12","author":"cattrall","year":"1997","journal-title":"Chemical Sensors"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1049\/el.2009.0215"},{"key":"ref14","author":"tsividis","year":"1999","journal-title":"Operation and Modeling of the MOS Transistor"},{"key":"ref15","author":"john","year":"1997","journal-title":"Analog Integrated Circuit Design"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/4.494195"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/4.826814"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS.1996.582779"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/81.481459"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/4.972154"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2005.06.069"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2004.12.065"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/BF02443738"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1979.19799"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/S0925-4005(99)00135-5"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/16.30936"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2004.836849"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/S0925-4005(02)00301-5"},{"key":"ref20","author":"chan","year":"2010","journal-title":"Robust low power CMOS methodologies for ISFETs instrumentation"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4\/5556407\/05556425.pdf?arnumber=5556425","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,11]],"date-time":"2021-10-11T00:47:18Z","timestamp":1633913238000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5556425\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,9]]},"references-count":20,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2010.2053863","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2010,9]]}}}