{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,1,11]],"date-time":"2024-01-11T23:58:47Z","timestamp":1705017527528},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2013,3,1]],"date-time":"2013-03-01T00:00:00Z","timestamp":1362096000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2013,3]]},"DOI":"10.1109\/jssc.2013.2237695","type":"journal-article","created":{"date-parts":[[2013,1,24]],"date-time":"2013-01-24T19:09:45Z","timestamp":1359054585000},"page":"814-826","source":"Crossref","is-referenced-by-count":5,"title":["On-Chip Combined C-V\/I-V Characterization System in 45-nm CMOS Technology"],"prefix":"10.1109","volume":"48","author":[{"given":"Simeon","family":"Realov","sequence":"first","affiliation":[]},{"given":"Kenneth L.","family":"Shepard","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","first-page":"218","article-title":"On-chip combined C-V\/I-V transistor characterization system in 45-nm CMOS","author":"realov","year":"2011","journal-title":"Proc Symp VLSI Circuits (VLSIC)"},{"key":"ref11","author":"sedra","year":"1998","journal-title":"Microelectronic Circuits"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ELMAGC.1999.801405"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2006.873368"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/16.772500"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2003.822651"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICMTS.2011.5976854"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ICMTS.2011.5976852"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ICMTS.2011.5976851"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1021\/ac60214a047"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2011.5770779"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2025342"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2006.1705315"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2007.911351"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1049\/el:20070017"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2032698"},{"key":"ref2","first-page":"519","article-title":"Fixed- and variable-length ring oscillators for variability characterization in 45 nm CMOS","author":"park","year":"2009","journal-title":"Proc IEEE Custom Integrated Circuits Conf CICC"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2005.863244"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2015789"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/S0026-2714(02)00027-6"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1989.572629"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2002.808305"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2003.822735"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1063\/1.3644960"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4\/6466407\/06419849.pdf?arnumber=6419849","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,11,29]],"date-time":"2021-11-29T20:28:38Z","timestamp":1638217718000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6419849\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,3]]},"references-count":24,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2013.2237695","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,3]]}}}