{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,25]],"date-time":"2026-04-25T14:37:05Z","timestamp":1777127825657,"version":"3.51.4"},"reference-count":23,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2015,11,1]],"date-time":"2015-11-01T00:00:00Z","timestamp":1446336000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2015,11]]},"DOI":"10.1109\/jssc.2015.2453964","type":"journal-article","created":{"date-parts":[[2015,8,13]],"date-time":"2015-08-13T21:51:11Z","timestamp":1439502671000},"page":"2591-2602","source":"Crossref","is-referenced-by-count":27,"title":["RF Transconductor Linearization Robust to Process, Voltage and Temperature Variations"],"prefix":"10.1109","volume":"50","author":[{"given":"Harish","family":"Kundur Subramaniyan","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Eric A. M.","family":"Klumperink","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Venkatesh","family":"Srinivasan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ali","family":"Kiaei","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bram","family":"Nauta","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2217832"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2009.4977392"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2003.821786"},{"key":"ref13","first-page":"74","article-title":"A blocker-tolerant wideband noise-cancelling receiver with a 2 dB noise figure","author":"murphy","year":"2012","journal-title":"IEEE Int Solid-State Circuits Conf (ISSCC) Dig Tech Papers"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2011.5746359"},{"key":"ref15","article-title":"A 0.9 V low-power 0.4–6 GHz linear SDR receiver in 28 nm CMOS","author":"borremans","year":"2013","journal-title":"Symp VLSI Circuits (VLSI) Dig"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2321148"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2003.818393"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2010.2055353"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ASSCC.2014.7008928"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MCOM.2014.6917411"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2011.2162460"},{"key":"ref6","first-page":"459","article-title":"A 15 mW, 70 kHz $1\/ {\\rm f}$ Corner direct conversion CMOS receiver","author":"sacchi","year":"2003","journal-title":"Proc IEEE Custom Integrated Circuits Conf CICC 2003"},{"key":"ref5","first-page":"41","article-title":"$ 1\/ {\\rm f} $ noise in passive CMOS mixers for low and zero IF integrated receivers","author":"redman-white","year":"2001","journal-title":"IEEE ESSCIRC 2001 Proc 27th European Solid-State Circuits Conf"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2032272"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.2004866"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.894307"},{"key":"ref1","year":"0","journal-title":"3GPP TS 36 104 “Evolved Universal Terrestrial Radio Access (E-UTRA) Base Station (BS) Radio Transmission and Reception"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2013762"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2319262"},{"key":"ref22","year":"0"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/82.754864"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/4.127337"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/4\/7307914\/07185467.pdf?arnumber=7185467","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T15:59:02Z","timestamp":1642003142000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7185467\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,11]]},"references-count":23,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2015.2453964","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2015,11]]}}}