{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,6]],"date-time":"2026-03-06T23:21:18Z","timestamp":1772839278168,"version":"3.50.1"},"reference-count":28,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2017,3,1]],"date-time":"2017-03-01T00:00:00Z","timestamp":1488326400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2017,3]]},"DOI":"10.1109\/jssc.2016.2646798","type":"journal-article","created":{"date-parts":[[2017,1,26]],"date-time":"2017-01-26T21:01:58Z","timestamp":1485464518000},"page":"834-843","source":"Crossref","is-referenced-by-count":60,"title":["Compact Thermal-Diffusivity-Based Temperature Sensors in 40-nm CMOS for SoC Thermal Monitoring"],"prefix":"10.1109","volume":"52","author":[{"given":"Ugur","family":"Sonmez","sequence":"first","affiliation":[]},{"given":"Fabio","family":"Sebastiano","sequence":"additional","affiliation":[]},{"given":"Kofi A. A.","family":"Makinwa","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.884865"},{"key":"ref11","first-page":"314","article-title":"A thermal-diffusivity-based temperature sensor with an untrimmed inaccuracy of ±0.2 °C (\n$3\\sigma $\n) from ?55 °C to 125 °C","author":"van vroonhoven","year":"2010","journal-title":"ISSCC Dig Tech Papers"},{"key":"ref12","first-page":"395","article-title":"A 0.008-mm2 area-optimized thermal-diffusivity-based temperature sensor in 160-nm CMOS for SoC thermal monitoring","author":"s\u00f6nmez","year":"2014","journal-title":"Proc Eur Solid-State Circuits Conf"},{"key":"ref13","first-page":"1","article-title":"A 2800-\n$\\mu $\nm2 thermal-diffusivity temperature sensor with VCO-based readout in 160-nm CMOS","author":"angevare","year":"2015","journal-title":"Proc A-SSCC"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2598765"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2012.2208669"},{"key":"ref16","first-page":"576","article-title":"A CMOS temperature-to-digital converter with an inaccuracy of ± 0.5 °C (\n$3\\sigma $\n) from ?55 to 125°C","author":"van vroonhoven","year":"2008","journal-title":"ISSCC Dig Tech Papers"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2020248"},{"key":"ref18","first-page":"754","article-title":"Combined electrical and thermal parameter extraction for transistor model","author":"veijola","year":"1997","journal-title":"Proc Eur Conf Circuit Theory Design"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.837247"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.proeng.2010.09.262"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2035553"},{"key":"ref27","first-page":"1","article-title":"A 28 nm CMOS ultra-compact thermal sensor in current-mode technique","author":"eberlein","year":"2016","journal-title":"Proc IEEE Symp VLSI Circuits (VLSI)"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2011.29"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2076610"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2396522"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2011.2161783"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2014.6858376"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2280039"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2013.2246254"},{"key":"ref1","first-page":"23","article-title":"Temperature measurement in the intel core duo processor","author":"rotem","year":"2006","journal-title":"Proc THERMINIC"},{"key":"ref20","first-page":"488","article-title":"A \n$4600\\mu $\nm2 1.5 °C (\n$3\\sigma $\n) 0.9kS\/s thermal-diffusivity temperature sensor with VCO-based readout","author":"quan","year":"2015","journal-title":"ISSCC Dig Tech Papers"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.917500"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1987.1052697"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ICSENS.2008.4716553"},{"key":"ref23","author":"perrott","year":"2016","journal-title":"Cppsim System Simulator Package"},{"key":"ref26","first-page":"271","article-title":"A temperature sensor with a 3 sigma inaccuracy of ± 2 °C without trimming from ?50 °C to 150 °C in a 16nm FinFET process","author":"chuang","year":"2015","journal-title":"Proc Eur Solid-State Circuits Conf (ESSCIRC)"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.81.245318"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/4\/7865876\/07835088.pdf?arnumber=7835088","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:19:55Z","timestamp":1642004395000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7835088\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,3]]},"references-count":28,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2016.2646798","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2017,3]]}}}