{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,13]],"date-time":"2026-01-13T05:25:09Z","timestamp":1768281909558,"version":"3.49.0"},"reference-count":32,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2018,1,1]],"date-time":"2018-01-01T00:00:00Z","timestamp":1514764800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2018,1]]},"DOI":"10.1109\/jssc.2017.2747215","type":"journal-article","created":{"date-parts":[[2017,9,20]],"date-time":"2017-09-20T18:12:49Z","timestamp":1505931169000},"page":"174-186","source":"Crossref","is-referenced-by-count":28,"title":["A 27 $\\mu \\text{W}$ 0.06 mm2 Background Resonance Frequency Tuning Circuit Based on Noise Observation for a 1.71 mW CT- $\\Delta \\Sigma $ MEMS Gyroscope Readout System With 0.9 \u00b0\/h Bias Instability"],"prefix":"10.1109","volume":"53","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-2274-9974","authenticated-orcid":false,"given":"Maximilian","family":"Marx","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Daniel","family":"De Dorigo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5747-2936","authenticated-orcid":false,"given":"Sebastian","family":"Nessler","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Stefan","family":"Rombach","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yiannos","family":"Manoli","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref32","first-page":"1","article-title":"A 0.57°\/h bias instability 0.067°\/ $\\sqrt {h}$ angle random walk MEMS gyroscope with CMOS readout circuit","author":"zhao","year":"2015","journal-title":"Proc Asian Solid-State Circuits Conf"},{"key":"ref31","first-page":"164","article-title":"A 27 $\\mu$ W 0.06 mm2 background resonance frequency tuning circuit based on noise observation for a 1.71 mW CT- $\\Delta \\Sigma$ MEMS gyroscope readout system with 0.9°\/h bias instability","author":"marx","year":"2017","journal-title":"IEEE Int Solid-State Circuits Conf (ISSCC) Dig Tech Papers"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2007.908921"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.852025"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2006.888604"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TRANSDUCERS.2011.5969183"},{"key":"ref13","first-page":"16","article-title":"A monolithic surface micromachined Z-axis gyroscope with digital output","author":"jiang","year":"2000","journal-title":"Proc Symp VLSI Circuits Dig Tech Papers"},{"key":"ref14","first-page":"296","article-title":"Sense finger dynamics in a $\\Sigma \\Delta $ force-feedback gyroscope","author":"seeger","year":"2000","journal-title":"Proc Solid-State Sens Actuator Workshop"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2006.869901"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2008.2012237"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/4.545807"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2035554"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2015.7168724"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2010.5537911"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2144170"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2002.1010772"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2015.7063134"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2016996"},{"key":"ref29","first-page":"408","article-title":"A self-test on wafer level for a MEM gyroscope readout based on $\\Delta \\Sigma $ modulation","author":"nessler","year":"2017","journal-title":"Proc IEEE Int Symp Circuits Syst"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2015.7313914"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2571670"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.2006465"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2011.5746238"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"177","DOI":"10.1109\/JSSC.2015.2496360","article-title":"A 3-axis gyroscope for electronic stability control with continuous self-test","volume":"51","author":"balachandran","year":"2016","journal-title":"IEEE J Solid-State Circuits"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2010.5434066"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2012.6271943"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1989.572629"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/4.278337"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2010.2047012"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1990.112329"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2015.7282077"},{"key":"ref25","article-title":"Method and device for tuning a first oscillator with a second oscillator and rotation rate sensor","author":"thomae","year":"2003"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/4\/8241022\/08047480.pdf?arnumber=8047480","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:25:17Z","timestamp":1642004717000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8047480\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,1]]},"references-count":32,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2017.2747215","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018,1]]}}}