{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,5]],"date-time":"2026-03-05T15:35:59Z","timestamp":1772724959776,"version":"3.50.1"},"reference-count":18,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2019,1]]},"DOI":"10.1109\/jssc.2018.2873582","type":"journal-article","created":{"date-parts":[[2018,11,13]],"date-time":"2018-11-13T19:55:13Z","timestamp":1542138913000},"page":"121-132","source":"Crossref","is-referenced-by-count":17,"title":["IBM z14: Processor Characterization and Power Management for High-Reliability Mainframe Systems"],"prefix":"10.1109","volume":"54","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0163-4788","authenticated-orcid":false,"given":"Christopher","family":"Berry","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5114-8361","authenticated-orcid":false,"given":"David","family":"Wolpert","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Christos","family":"Vezrytzis","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Richard","family":"Rizzolo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sean","family":"Carey","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yaniv","family":"Maroz","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hunter","family":"Shi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dureseti","family":"Chidambarrao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Christian","family":"Jacobi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Anthony","family":"Saporito","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0583-156X","authenticated-orcid":false,"given":"Thomas","family":"Strach","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5341-8916","authenticated-orcid":false,"given":"Alper","family":"Buyuktosunoglu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Preetham","family":"Lobo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Pierce","family":"Chuang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1380-9258","authenticated-orcid":false,"given":"Pawel","family":"Owczarczyk","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ramon","family":"Bertran","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4625-1529","authenticated-orcid":false,"given":"Tobias","family":"Webel","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3124-4265","authenticated-orcid":false,"given":"Phillip J.","family":"Restle","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2013.9"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2284647"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2017.7870452"},{"key":"ref13","first-page":"152","article-title":"A 16 nm all-digital auto-calibrating adaptive clock distribution for supply voltage droop tolerance across a wide operating range","author":"bowman","year":"2015","journal-title":"IEEE ISSCC Dig Tech Papers"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2017.7870449"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2012.27"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2014.12"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1147\/JRD.2015.2446872"},{"key":"ref18","first-page":"398","article-title":"A distributed critical-path timing monitor for a 65 nm high-performance microprocessor","author":"drake","year":"2007","journal-title":"IEEE ISSCC Dig Tech Papers"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2018.8310171"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1147\/JRD.2018.2800499"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1147\/JRD.2015.2418591"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1147\/JRD.2015.2446871"},{"key":"ref8","author":"koprowski","year":"1999","journal-title":"Logic built-in self test selective signature generation"},{"key":"ref7","first-page":"398","article-title":"A distributed critical-path timing monitor for a 65nm high-performance microprocessor","author":"drake","year":"2007","journal-title":"IEEE ISSCC Dig Tech Papers"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1147\/JRD.2018.2800218"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1147\/JRD.2018.2798718"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2169308"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/4\/8613098\/08533619.pdf?arnumber=8533619","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,13]],"date-time":"2022-07-13T20:58:39Z","timestamp":1657745919000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8533619\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,1]]},"references-count":18,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2018.2873582","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019,1]]}}}