{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,9]],"date-time":"2026-04-09T14:33:30Z","timestamp":1775745210661,"version":"3.50.1"},"reference-count":39,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2019,4,1]],"date-time":"2019-04-01T00:00:00Z","timestamp":1554076800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,4,1]],"date-time":"2019-04-01T00:00:00Z","timestamp":1554076800000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,4,1]],"date-time":"2019-04-01T00:00:00Z","timestamp":1554076800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,4,1]],"date-time":"2019-04-01T00:00:00Z","timestamp":1554076800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","award":["CAREER ECCS-1653100"],"award-info":[{"award-number":["CAREER ECCS-1653100"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","award":["ECCS-1809917"],"award-info":[{"award-number":["ECCS-1809917"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100007187","name":"Lincoln Laboratory, Massachusetts Institute of Technology","doi-asserted-by":"publisher","award":["ACC-672"],"award-info":[{"award-number":["ACC-672"]}],"id":[{"id":"10.13039\/100007187","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100004361","name":"Texas Instruments","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100004361","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2019,4]]},"DOI":"10.1109\/jssc.2018.2880920","type":"journal-article","created":{"date-parts":[[2018,12,19]],"date-time":"2018-12-19T20:09:01Z","timestamp":1545250141000},"page":"914-926","source":"Crossref","is-referenced-by-count":23,"title":["Chip-Scale Molecular Clock"],"prefix":"10.1109","volume":"54","author":[{"given":"Cheng","family":"Wang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4905-4857","authenticated-orcid":false,"given":"Xiang","family":"Yi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0452-5782","authenticated-orcid":false,"given":"James","family":"Mawdsley","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2307-5382","authenticated-orcid":false,"given":"Mina","family":"Kim","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6733-529X","authenticated-orcid":false,"given":"Zhi","family":"Hu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yaqing","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bradford","family":"Perkins","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ruonan","family":"Han","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TTHZ.2018.2791841"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1979.4314780"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1007\/s10762-017-0436-4"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC.2016.7508277"},{"key":"ref31","first-page":"18","article-title":"Rapid and energy-efficient molecular sensing using dual mm-Wave combs in 65 nm CMOS: A 220-to-320 GHz spectrometer with 5.2 mW radiated power and 14.6-to-19.5 dB noise figure","author":"wang","year":"2017","journal-title":"IEEE Int Solid-State Circuits Conf (ISSCC) Dig Tech Papers"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1021\/jp407980f"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2011.5746214"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1063\/1.3696895"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2015.7063118"},{"key":"ref34","first-page":"260","article-title":"A 300 GHz frequency synthesizer with 7.9% locking range in 90 nm SiGe BiCMOS","volume":"57","author":"chiang","year":"2014","journal-title":"IEEE Int Solid-State Circuits Conf (ISSCC) Dig Tech Papers"},{"key":"ref10","first-page":"339","article-title":"The chip-scale atomic clock—Low-power physics package","author":"lutwak","year":"2004","journal-title":"Proc 31st Annu Precise Time and Time Interval (PTTI) Meeting"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1117\/12.701591"},{"key":"ref12","year":"2017","journal-title":"QUANTUM SA 45s Chip Scale Atomic Clock"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1143\/JJAP.38.6174"},{"key":"ref14","first-page":"1","article-title":"Cesium D line data","volume":"4710","author":"steck","year":"2008","journal-title":"Theoretical Division"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TTHZ.2011.2159648"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.3390\/metabo5010003"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2016.7573400"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2018.2812818"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TTHZ.2015.2513278"},{"key":"ref28","doi-asserted-by":"crossref","first-page":"170","DOI":"10.1109\/PROC.1966.4629","article-title":"short-term stability of passive atomic frequency standards","volume":"54","author":"lacey","year":"1966","journal-title":"Proceedings of the IEEE"},{"key":"ref4","first-page":"1","article-title":"Principles of atomic clocks","author":"lutwak","year":"2011","journal-title":"Proc IEEE Int Freq Control Symp"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1981.6312408"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/OCEANS.2016.7761268"},{"key":"ref6","first-page":"1","article-title":"A ±3 ppm 1.1 mW FBAR frequency reference with 750 MHz output and 750 mV supply","author":"sankaragomathi","year":"2015","journal-title":"IEEE Int Solid-State Circuits Conf (ISSCC) Dig Tech Papers"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.jms.2005.08.012"},{"key":"ref5","article-title":"Fundamentals of time and frequency","author":"lombardi","year":"2001","journal-title":"The Mechatronics Handbook"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/BF02749417"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1038\/nature12941"},{"key":"ref2","year":"2017","journal-title":"Underwater Exploration With Chip Scale Atomic Clocks (CSAC)"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1063\/1.1787942"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.6028\/NIST.SP.1065"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2016.7418089"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-018-0102-4"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2755693"},{"key":"ref24","author":"townes","year":"2012","journal-title":"Microwave Spectroscopy"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2018.8502271"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1063\/1.3253139"},{"key":"ref25","year":"0","journal-title":"The HITRAN Database High-Resolution Transmission Molecular Absorption Database"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"https:\/\/ieeexplore.ieee.org\/ielaam\/4\/8674728\/8581584-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/4\/8674728\/08581584.pdf?arnumber=8581584","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,13]],"date-time":"2022-07-13T21:13:12Z","timestamp":1657746792000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8581584\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,4]]},"references-count":39,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2018.2880920","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019,4]]}}}