{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,24]],"date-time":"2026-03-24T06:55:33Z","timestamp":1774335333428,"version":"3.50.1"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2019,11,1]],"date-time":"2019-11-01T00:00:00Z","timestamp":1572566400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/501100003246","name":"Nederlandse Organisatie voor Wetenschappelijk Onderzoek","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100003246","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2019,11]]},"DOI":"10.1109\/jssc.2019.2938412","type":"journal-article","created":{"date-parts":[[2019,9,19]],"date-time":"2019-09-19T20:02:10Z","timestamp":1568923330000},"page":"3203-3214","source":"Crossref","is-referenced-by-count":89,"title":["A Modular, Direct Time-of-Flight Depth Sensor in 45\/65-nm 3-D-Stacked CMOS Technology"],"prefix":"10.1109","volume":"54","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9121-3196","authenticated-orcid":false,"given":"Augusto","family":"Ronchini Ximenes","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0070-170X","authenticated-orcid":false,"given":"Preethi","family":"Padmanabhan","sequence":"additional","affiliation":[]},{"given":"Myung-Jae","family":"Lee","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1475-2054","authenticated-orcid":false,"given":"Yuichiro","family":"Yamashita","sequence":"additional","affiliation":[]},{"given":"Dun-Nian","family":"Yaung","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0620-3365","authenticated-orcid":false,"given":"Edoardo","family":"Charbon","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref31","year":"2019","journal-title":"R-SERIES SIPM Silicon Photomultiplier Sensors"},{"key":"ref30","year":"1992","journal-title":"Solar Energy–Reflectance Solar Spectral Irradiance at the Ground at Different Receiving conditions—Part 1 Direct Normal and Hemispherical Solar Irradiance for Air Mass 1 5"},{"key":"ref10","year":"2019","journal-title":"Proximity Sensor"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.1983.4767429"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/SENSOR.2007.4300677"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2623635"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1038\/nphoton.2010.175"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2227607"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2868315"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.procs.2016.05.455"},{"key":"ref18","first-page":"1","article-title":"A time-correlated single-photon-counting sensor with 14 GS\/S histogramming time-to-digital converter","author":"dutton","year":"2015","journal-title":"IEEE Int Solid-State Circuits Conf (ISSCC) Dig Tech Papers"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2688126"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2018.2803087"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.3390\/s120201437"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/JSTQE.2018.2827669"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP.2007.4379556"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2003.1211354"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/JSTQE.2014.2342197"},{"key":"ref5","first-page":"2050","article-title":"A \n$128\\times128\\,\\,33$\n mw 30 frames\/s single-chip stereo imager","author":"philipp","year":"2006","journal-title":"IEEE Int Solid-State Circuits Conf (ISSCC) Dig Tech Papers"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2364270"},{"key":"ref7","first-page":"1","article-title":"Backside illuminated SPAD image sensor with \n$7.83~\\mu\\text{m}$\n pitch in 3D-stacked CMOS technology","author":"al abbas","year":"2016","journal-title":"IEDM Tech Dig"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MCOM.2017.1601089"},{"key":"ref9","year":"2019","journal-title":"Time-of-Flight Camera"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ICCE.2007.341537"},{"key":"ref20","first-page":"96","article-title":"A \n$256\\times256\\,\\,45$\n\/65 nm 3D-stacked SPAD-based direct TOF image sensor for LiDAR applications with optical polar modulation for up to 18.6 dB interference suppression","author":"ximenes","year":"2018","journal-title":"IEEE Int Solid-State Circuits Conf (ISSCC) Dig Tech Papers"},{"key":"ref22","first-page":"331","article-title":"Characterization of large-scale non-uniformities in a 20 k TDC\/SPAD array integrated in a 130 nm CMOS process","author":"veerappan","year":"2011","journal-title":"Proc Euro Solid-State Device Res Conf (ESSDERC)"},{"key":"ref21","first-page":"312","article-title":"A \n$160\\times128$\n single-photon image sensor with on-pixel 55 ps 10 b time-to-digital converter","author":"veerappan","year":"2011","journal-title":"IEEE Int Solid-State Circuits Conf (ISSCC) Dig Tech Papers"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.3390\/s18103413"},{"key":"ref23","first-page":"262","article-title":"Single-photon image sensors in CMOS: Picosecond resolution for three-dimensional imaging","author":"niclass","year":"2008"},{"key":"ref26","article-title":"American national standard for safe use of lasers","author":"white","year":"2007"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/4.845191"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/4\/8880462\/08844705.pdf?arnumber=8844705","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,8,10]],"date-time":"2021-08-10T19:41:24Z","timestamp":1628624484000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8844705\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,11]]},"references-count":31,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2019.2938412","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019,11]]}}}