{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,25]],"date-time":"2026-04-25T14:35:42Z","timestamp":1777127742364,"version":"3.51.4"},"reference-count":12,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2019,12,1]],"date-time":"2019-12-01T00:00:00Z","timestamp":1575158400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,12,1]],"date-time":"2019-12-01T00:00:00Z","timestamp":1575158400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,12,1]],"date-time":"2019-12-01T00:00:00Z","timestamp":1575158400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Semiconductor Research Consortium","award":["2712.007"],"award-info":[{"award-number":["2712.007"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2019,12]]},"DOI":"10.1109\/jssc.2019.2938626","type":"journal-article","created":{"date-parts":[[2019,9,25]],"date-time":"2019-09-25T20:11:42Z","timestamp":1569442302000},"page":"3386-3395","source":"Crossref","is-referenced-by-count":43,"title":["A Calibration-Free Time-Interleaved Fourth-Order Noise-Shaping SAR ADC"],"prefix":"10.1109","volume":"54","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5046-3917","authenticated-orcid":false,"given":"Lu","family":"Jie","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0796-8124","authenticated-orcid":false,"given":"Boyi","family":"Zheng","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5070-7512","authenticated-orcid":false,"given":"Michael P.","family":"Flynn","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","first-page":"330","article-title":"A 40 MHz-BW 320 MS\/s passive noise-shaping SAR ADC with passive signal-residue summation in 14 nm FinFET","author":"lin","year":"2019","journal-title":"IEEE Int Solid-State Circuits Conf (ISSCC) Dig Tech Papers"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2871081"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.23919\/VLSIC.2017.8008491"},{"key":"ref6","author":"murmann","year":"2019","journal-title":"ADC Performance Survey 1997–2013"},{"key":"ref11","first-page":"230","article-title":"A 50 MHZ-BW continuous-time \n$\\Delta\\Sigma$\n ADC with dynamic error correction achieving 79.8 dB SNDR and 95.2 dB SFDR","author":"he","year":"2018","journal-title":"IEEE Int Solid-State Circuits Conf (ISSCC) Dig Tech Papers"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2019.8662313"},{"key":"ref12","first-page":"1","article-title":"A 13.3 mW 60 MHz bandwidth, 76 dB DR 6 GS\/s CT$\\Delta\\Sigma\\text{M}$\n with time interleaved FIR feedback","author":"jain","year":"2016","journal-title":"Proc IEEE Symp VLSI Circuits (VLSI-Circuits)"},{"key":"ref8","first-page":"248","article-title":"A 14b 40 MS\/s Redundant SAR ADC with 480 MHz Clock in 0.13 pm CMOS","author":"hesener","year":"2007","journal-title":"IEEE Int Solid-State Circuits Conf (ISSCC) Dig Tech Papers"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2000.848838"},{"key":"ref2","first-page":"466","article-title":"A 0.46 mW 5 MHz-BW 79.7 dB-SNDR noise-shaping SAR ADC with dynamic-amplifier-based FIR-IIR filter","author":"liu","year":"2017","journal-title":"IEEE Int Solid-State Circuits Conf (ISSCC) Dig Tech Papers"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.884231"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2217874"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/4\/8910478\/08848451.pdf?arnumber=8848451","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,13]],"date-time":"2022-07-13T21:11:27Z","timestamp":1657746687000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8848451\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,12]]},"references-count":12,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2019.2938626","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019,12]]}}}