{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,28]],"date-time":"2026-04-28T17:55:49Z","timestamp":1777398949145,"version":"3.51.4"},"reference-count":17,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100004358","name":"Samsung","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100004358","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2020,4]]},"DOI":"10.1109\/jssc.2019.2959502","type":"journal-article","created":{"date-parts":[[2019,12,31]],"date-time":"2019-12-31T07:06:17Z","timestamp":1577775977000},"page":"889-897","source":"Crossref","is-referenced-by-count":63,"title":["A VGA Indirect Time-of-Flight CMOS Image Sensor With 4-Tap 7-$\\mu$ m Global-Shutter Pixel and Fixed-Pattern Phase Noise Self-Compensation"],"prefix":"10.1109","volume":"55","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-0732-672X","authenticated-orcid":false,"given":"Min-Sun","family":"Keel","sequence":"first","affiliation":[]},{"given":"Young-Gu","family":"Jin","sequence":"additional","affiliation":[]},{"given":"Youngchan","family":"Kim","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8456-0344","authenticated-orcid":false,"given":"Daeyun","family":"Kim","sequence":"additional","affiliation":[]},{"given":"Yeomyung","family":"Kim","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0246-1938","authenticated-orcid":false,"given":"Myunghan","family":"Bae","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4065-356X","authenticated-orcid":false,"given":"Bumsik","family":"Chung","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3488-9875","authenticated-orcid":false,"given":"Sooho","family":"Son","sequence":"additional","affiliation":[]},{"given":"Hogyun","family":"Kim","sequence":"additional","affiliation":[]},{"given":"Taemin","family":"An","sequence":"additional","affiliation":[]},{"given":"Sung-Ho","family":"Choi","sequence":"additional","affiliation":[]},{"given":"Taesub","family":"Jung","sequence":"additional","affiliation":[]},{"given":"Yonghun","family":"Kwon","sequence":"additional","affiliation":[]},{"given":"Sungyoung","family":"Seo","sequence":"additional","affiliation":[]},{"given":"Sae-Young","family":"Kim","sequence":"additional","affiliation":[]},{"given":"Kwanghyuk","family":"Bae","sequence":"additional","affiliation":[]},{"given":"Seung-Chul","family":"Shin","sequence":"additional","affiliation":[]},{"given":"Myoungoh","family":"Ki","sequence":"additional","affiliation":[]},{"given":"Seoungjae","family":"Yoo","sequence":"additional","affiliation":[]},{"given":"Chang-Rok","family":"Moon","sequence":"additional","affiliation":[]},{"given":"Hyunsurk","family":"Ryu","sequence":"additional","affiliation":[]},{"given":"Joonseok","family":"Kim","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2006.888679"},{"key":"ref2","first-page":"92","article-title":"A 20ch TDC\/ADC hybrid SoC for \n$240\\times96$\n-pixel 10%-reflection <0.125%-precision 200 m-range-imaging LiDAR with smart accumulation technique","volume-title":"IEEE Int. Solid-State Circuits Conf. (ISSCC) Dig. Tech. Papers","author":"Yoshioka"},{"key":"ref3","first-page":"1","article-title":"A 67,392-SPAD PVTB-compensated multi-channel digital SiPM with 432 column-parallel 48 ps 17-bit TDCs for endoscopic time-of-flight PET","author":"Carimatto","year":"2015","journal-title":"IEEE Int. Solid-State Circuits Conf. (ISSCC) Dig. Tech. Papers"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2364270"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2002.1015102"},{"key":"ref6","first-page":"94","article-title":"IMpixel 65 nm BSI 320 MHz demodulated TOF Image sensor with \n$3~\\mu\\text{m}$\n global shutter pixels and analog binning","volume-title":"IEEE Int. Solid-State Circuits Conf. (ISSCC) Dig. Tech. Papers","author":"Bamji"},{"key":"ref7","first-page":"C258","article-title":"A \n$640\\times480$\n indirect time-of-flight CMOS image sensor with 4-tap 7-\n$\\mu\\text{m}$\n global-shutter pixel and fixed-pattern phase noise self-compensation scheme","volume-title":"Symp. VLSI Circuits Dig. Tech. Papers","author":"Keel"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/3.910448"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.3390\/rs3112461"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1117\/12.525654"},{"key":"ref11","first-page":"1","article-title":"Pixel technology for improving IR quantum efficiency of backside-illuminated CMOS image sensor","volume-title":"Proc. Int. Image Sensor Workshop","author":"Park"},{"key":"ref12","first-page":"124","article-title":"A 1\/4-inch 8 Mpixel CMOS image sensor with 3D backside-illuminated \n$1.12~\\mu\\text{m}$\n pixel with front-side deep-trench isolation and vertical transfer gate","volume-title":"IEEE Int. Solid-State Circuits Conf. (ISSCC) Dig. Tech. Papers","author":"Ahn"},{"key":"ref13","article-title":"VCSEL based sensors for distance and velocity","volume":"9766","author":"Moench","year":"2016","journal-title":"Proc. SPIE"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2006.1696261"},{"key":"ref15","volume-title":"Signal and Power Integrity-Simplified","author":"Bogatin","year":"2010"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/4.913751"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2010.2101060"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/4\/9048008\/08945221.pdf?arnumber=8945221","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,24]],"date-time":"2024-01-24T00:13:09Z","timestamp":1706055189000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8945221\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,4]]},"references-count":17,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2019.2959502","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,4]]}}}