{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T16:22:25Z","timestamp":1777652545156,"version":"3.51.4"},"reference-count":23,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Department of Science and Technology (DST), Government of India, under the ITPAR-III Scheme"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2020,11]]},"DOI":"10.1109\/jssc.2020.3017639","type":"journal-article","created":{"date-parts":[[2020,8,28]],"date-time":"2020-08-28T20:10:14Z","timestamp":1598645414000},"page":"3036-3050","source":"Crossref","is-referenced-by-count":27,"title":["An Auto-Calibrated Resistive Measurement System With Low Noise Instrumentation ASIC"],"prefix":"10.1109","volume":"55","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2951-7161","authenticated-orcid":false,"given":"Meraj","family":"Ahmad","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3328-9309","authenticated-orcid":false,"given":"Shahid","family":"Malik","sequence":"additional","affiliation":[]},{"given":"Sourya","family":"Dewan","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0618-5301","authenticated-orcid":false,"given":"Arnesh K.","family":"Bose","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2288-8779","authenticated-orcid":false,"given":"Dinesh","family":"Maddipatla","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2841-741X","authenticated-orcid":false,"given":"Binu B.","family":"Narakathu","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2981-6321","authenticated-orcid":false,"given":"Massood Z.","family":"Atashbar","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6568-3736","authenticated-orcid":false,"given":"Maryam Shojaei","family":"Baghini","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2911888"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2016.2625310"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2012.2224113"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2359962"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2085930"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4614-3731-4"},{"key":"ref16","year":"2018","journal-title":"ADS131A04 24-Bit 128-kSPS 4-Channel Simultaneous-Sampling Delta-Sigma ADC"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2274831"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.201200498"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2013.11.034"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2012.2236646"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2777010"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/LSENS.2019.2919894"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.891724"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/19.982961"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2013.2282122"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2266025"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/978-90-481-9828-3"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4419-6466-3"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.carbon.2012.08.048"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2012.2221163"},{"key":"ref21","doi-asserted-by":"crossref","first-page":"1315","DOI":"10.1177\/0021998310393296","article-title":"A carbon nanotube\/polymer strain sensor with linear and anti-symmetric piezoresistivity","volume":"45","author":"yin","year":"2011","journal-title":"J Compos Mater"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2868263"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/4\/9237188\/09179757.pdf?arnumber=9179757","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T13:36:32Z","timestamp":1651066592000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9179757\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,11]]},"references-count":23,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2020.3017639","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,11]]}}}