{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,18]],"date-time":"2026-03-18T13:42:58Z","timestamp":1773841378243,"version":"3.50.1"},"reference-count":23,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2022,2,1]],"date-time":"2022-02-01T00:00:00Z","timestamp":1643673600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"name":"Israel Ministry of Science"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2022,2]]},"DOI":"10.1109\/jssc.2021.3091586","type":"journal-article","created":{"date-parts":[[2021,7,5]],"date-time":"2021-07-05T19:56:46Z","timestamp":1625515006000},"page":"596-608","source":"Crossref","is-referenced-by-count":10,"title":["A Method for Mitigation of Droop Timing Errors Including a 500 MHz Droop Detector and Dual Mode Logic"],"prefix":"10.1109","volume":"57","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1089-1081","authenticated-orcid":false,"given":"Yizhak","family":"Shifman","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9038-1278","authenticated-orcid":false,"given":"Inbal","family":"Stanger","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2011-6329","authenticated-orcid":false,"given":"Netanel","family":"Shavit","sequence":"additional","affiliation":[]},{"given":"Ramiro","family":"Taco","sequence":"additional","affiliation":[]},{"given":"Alexander","family":"Fish","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9184-8642","authenticated-orcid":false,"given":"Joseph","family":"Shor","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/APEC.2014.6803344"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2669025"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.825120"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2601319"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.2992892"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2018.8310303"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2007.373462"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2015.7062971"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.842853"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2016.7527223"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2017.7870452"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2013.2262015"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2882139"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/LSSC.2020.3011636"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2013.2257902"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2013.03.005"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/S3S.2018.8640133"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2020.3013331"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/4.68134"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2167814"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2396522"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ICCE.2010.5670687"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2473655"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/4\/9694622\/09474918.pdf?arnumber=9474918","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,11]],"date-time":"2024-01-11T23:43:42Z","timestamp":1705016622000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9474918\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,2]]},"references-count":23,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2021.3091586","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,2]]}}}