{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,20]],"date-time":"2026-03-20T03:21:39Z","timestamp":1773976899168,"version":"3.50.1"},"reference-count":32,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000028","name":"Semiconductor Research Corporation through the Center for Brain-Inspired Computing","doi-asserted-by":"publisher","award":["2777.005"],"award-info":[{"award-number":["2777.005"]}],"id":[{"id":"10.13039\/100000028","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100000028","name":"Semiconductor Research Corporation through the Center for Brain-Inspired Computing","doi-asserted-by":"publisher","award":["2777.006"],"award-info":[{"award-number":["2777.006"]}],"id":[{"id":"10.13039\/100000028","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Applications and Systems-Driven Center for Energy-Efficient Integrated Nano Technologies","award":["2776.037"],"award-info":[{"award-number":["2776.037"]}]},{"name":"TSMC with technical discussions and chip fabrication"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2022,1]]},"DOI":"10.1109\/jssc.2021.3101209","type":"journal-article","created":{"date-parts":[[2021,8,9]],"date-time":"2021-08-09T20:33:19Z","timestamp":1628541199000},"page":"68-79","source":"Crossref","is-referenced-by-count":50,"title":["A 40-nm, 64-Kb, 56.67 TOPS\/W Voltage-Sensing Computing-In-Memory\/Digital RRAM Macro Supporting Iterative Write With Verification and Online Read-Disturb Detection"],"prefix":"10.1109","volume":"57","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-7373-7028","authenticated-orcid":false,"given":"Jong-Hyeok","family":"Yoon","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3035-1106","authenticated-orcid":false,"given":"Muya","family":"Chang","sequence":"additional","affiliation":[]},{"given":"Win-San","family":"Khwa","sequence":"additional","affiliation":[]},{"given":"Yu-Der","family":"Chih","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6905-6350","authenticated-orcid":false,"given":"Meng-Fan","family":"Chang","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8391-0576","authenticated-orcid":false,"given":"Arijit","family":"Raychowdhury","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2881288"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3028298"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2935533"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2642198"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2019.2928043"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2963616"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2869150"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP.2014.6855225"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2782087"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2822703"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2019.8662419"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/VLSICircuits18222.2020.9162878"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2018.2848999"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2019.8662392"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6463\/ab7794"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPDS.2014.2324563"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2018.8614620"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2018.8310400"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2951363"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/CICC51472.2021.9431558"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC19947.2020.9063078"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC19947.2020.9062979"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2018.8510676"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2015.7409720"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2018.8310399"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/CICC51472.2021.9431412"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2016.7838346"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42613.2021.9365926"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2018.8310392"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2020.3016587"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2020.3015178"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6641\/abb842"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/4\/9664397\/09509297.pdf?arnumber=9509297","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,11]],"date-time":"2024-01-11T22:55:15Z","timestamp":1705013715000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9509297\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,1]]},"references-count":32,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2021.3101209","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,1]]}}}