{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,25]],"date-time":"2026-01-25T01:34:46Z","timestamp":1769304886692,"version":"3.49.0"},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2022,5,1]],"date-time":"2022-05-01T00:00:00Z","timestamp":1651363200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,5,1]],"date-time":"2022-05-01T00:00:00Z","timestamp":1651363200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,5,1]],"date-time":"2022-05-01T00:00:00Z","timestamp":1651363200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2022,5]]},"DOI":"10.1109\/jssc.2022.3146872","type":"journal-article","created":{"date-parts":[[2022,2,15]],"date-time":"2022-02-15T20:46:08Z","timestamp":1644957968000},"page":"1257-1266","source":"Crossref","is-referenced-by-count":11,"title":["A 5G FR2 Power-Amplifier With an Integrated Power-Detector for Closed-Loop EIRP Control"],"prefix":"10.1109","volume":"57","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5401-4112","authenticated-orcid":false,"given":"Venumadhav","family":"Bhagavatula","sequence":"first","affiliation":[{"name":"Samsung Semiconductor, Inc., San Jose, CA, USA"}]},{"given":"Fan","family":"Zhang","sequence":"additional","affiliation":[{"name":"Samsung Semiconductor, Inc., San Jose, CA, USA"}]},{"given":"Chechun","family":"Kuo","sequence":"additional","affiliation":[{"name":"Samsung Semiconductor, Inc., San Jose, CA, USA"}]},{"given":"Anirban","family":"Sarkar","sequence":"additional","affiliation":[{"name":"Samsung Semiconductor, Inc., San Jose, CA, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0677-0623","authenticated-orcid":false,"given":"Ashutosh","family":"Verma","sequence":"additional","affiliation":[{"name":"Samsung Semiconductor, Inc., San Jose, CA, USA"}]},{"given":"Tienyu","family":"Chang","sequence":"additional","affiliation":[{"name":"Samsung Semiconductor, Inc., San Jose, CA, USA"}]},{"given":"Xiaohua","family":"Yu","sequence":"additional","affiliation":[{"name":"Samsung Semiconductor, Inc., San Jose, CA, USA"}]},{"given":"Dae-Young","family":"Yoon","sequence":"additional","affiliation":[{"name":"Samsung Electronics Device Solutions, Hwaseong-si, Gyeonggi-do, South Korea"}]},{"given":"Ivan Siu-Chuang","family":"Lu","sequence":"additional","affiliation":[{"name":"Samsung Semiconductor, Inc., San Jose, CA, USA"}]},{"given":"Sang Won","family":"Son","sequence":"additional","affiliation":[{"name":"Samsung Semiconductor, Inc., San Jose, CA, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8053-6491","authenticated-orcid":false,"given":"Thomas Byunghak","family":"Cho","sequence":"additional","affiliation":[{"name":"Samsung Electronics Device Solutions, Hwaseong-si, Gyeonggi-do, South Korea"}]}],"member":"263","reference":[{"key":"ref1","volume-title":"User Equipment (UE) Radio Transmission and Reception; Part 2: Range 2 Stand Alone","year":"2020"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.837251"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3070800"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3022617"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC19947.2020.9063157"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC19947.2020.9063006"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC51843.2021.9490447"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.2011032"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2016.2519030"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2014.6757338"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.899116"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.880592"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC.2019.8701788"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42613.2021.9366018"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2021.3068012"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2928694"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42613.2021.9365736"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2013.2247698"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2010.5434059"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2007.906497"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/MW-M.2006.247908"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2013.2243750"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2018.8310188"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2817606"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/4\/9761850\/09714168.pdf?arnumber=9714168","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,17]],"date-time":"2024-01-17T22:55:56Z","timestamp":1705532156000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9714168\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,5]]},"references-count":24,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2022.3146872","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,5]]}}}