{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,14]],"date-time":"2026-04-14T20:42:39Z","timestamp":1776199359040,"version":"3.50.1"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2022,8,1]],"date-time":"2022-08-01T00:00:00Z","timestamp":1659312000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,8,1]],"date-time":"2022-08-01T00:00:00Z","timestamp":1659312000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,8,1]],"date-time":"2022-08-01T00:00:00Z","timestamp":1659312000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2022,8]]},"DOI":"10.1109\/jssc.2022.3151229","type":"journal-article","created":{"date-parts":[[2022,3,1]],"date-time":"2022-03-01T20:38:35Z","timestamp":1646167115000},"page":"2509-2520","source":"Crossref","is-referenced-by-count":28,"title":["Static CMOS Physically Unclonable Function Based on 4T Voltage Divider With 0.6%\u20131.5% Bit Instability at 0.4\u20131.8 V Operation in 180 nm"],"prefix":"10.1109","volume":"57","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-8689-4073","authenticated-orcid":false,"given":"Massimo","family":"Vatalaro","sequence":"first","affiliation":[{"name":"Department of Computer Engineering, Modeling, Electronics and Systems Engineering (DIMES), University of Calabria, Rende, Italy"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1184-1721","authenticated-orcid":false,"given":"Raffaele","family":"De Rose","sequence":"additional","affiliation":[{"name":"Department of Computer Engineering, Modeling, Electronics and Systems Engineering (DIMES), University of Calabria, Rende, Italy"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6480-9218","authenticated-orcid":false,"given":"Marco","family":"Lanuzza","sequence":"additional","affiliation":[{"name":"Department of Computer Engineering, Modeling, Electronics and Systems Engineering (DIMES), University of Calabria, Rende, Italy"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5011-6621","authenticated-orcid":false,"given":"Felice","family":"Crupi","sequence":"additional","affiliation":[{"name":"Department of Computer Engineering, Modeling, Electronics and Systems Engineering (DIMES), University of Calabria, Rende, Italy"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.comnet.2010.05.010"},{"key":"ref2","volume-title":"Enabling the Internet of Things-From Integrated Circuits to Integrated System","author":"Alioto","year":"2017"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MSSC.2017.2745799"},{"key":"ref4","volume-title":"Physically Unclonable Functions-From Basic Design Principles to Advanced Hardware Security Applications","author":"Halak","year":"2018"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-019-14066-5"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1063\/5.0013408"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.910961"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2120650"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1002\/cta.2282"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2886350"},{"key":"ref11","first-page":"254","article-title":"A physically unclonable function with BER <10\u20138 for robust chip authentication using oscillator collapse in 40 nm CMOS","volume-title":"IEEE ISSCC Dig. Tech. Papers","author":"Yang"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2791460"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2963002"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3035207"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42613.2021.9366019"},{"key":"ref16","first-page":"278","article-title":"A 0.19 pJ\/b PVT-variation-tolerant hybrid physically unclonable function circuit for 100% stable secure key generation in 22 nm CMOS","volume-title":"IEEE ISSCC Dig. Tech. Papers","author":"Mathew"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2636859"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2506641"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2865584"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3050959"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2586498"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2017.7870303"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2938133"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2018.8310219"},{"key":"ref25","first-page":"158","article-title":"Physically unclonable function for secure key generation with a key error rate of 2E-38 in 45 nm smart-card chips","volume-title":"IEEE ISSCC Dig. Tech. Papers","author":"Karpinskyy"},{"key":"ref26","first-page":"426","article-title":"Physically unclonable function in 28 nm FDSOI technology achieving high reliability for AEC-Q 100 grade 1 and ISO 26262 ASIL-B","volume-title":"IEEE ISSCC Dig. Tech. Papers","author":"Choi"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3081440"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4614-5040-5"},{"key":"ref29","first-page":"131","article-title":"A statistical test suite for random and pseudorandom number generators for cryptographic applications","author":"Rukhin","year":"2010"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/4\/9837319\/09723453.pdf?arnumber=9723453","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,17]],"date-time":"2024-01-17T22:58:06Z","timestamp":1705532286000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9723453\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,8]]},"references-count":29,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2022.3151229","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,8]]}}}