{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,29]],"date-time":"2026-01-29T23:11:58Z","timestamp":1769728318554,"version":"3.49.0"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2022,9,1]],"date-time":"2022-09-01T00:00:00Z","timestamp":1661990400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,9,1]],"date-time":"2022-09-01T00:00:00Z","timestamp":1661990400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,9,1]],"date-time":"2022-09-01T00:00:00Z","timestamp":1661990400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"\u201cNanosystems at the Edge\u201d through the Singapore A*STAR SERC AME Program","award":["A18A4b0055"],"award-info":[{"award-number":["A18A4b0055"]}]},{"name":"Minister of Science and Technology, China, through the National Science and Technology Major Project","award":["2018AAA0103100"],"award-info":[{"award-number":["2018AAA0103100"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61661166010"],"award-info":[{"award-number":["61661166010"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100017610","name":"Shenzhen Science and Technology Program","doi-asserted-by":"publisher","award":["JCYJ20180306170435280"],"award-info":[{"award-number":["JCYJ20180306170435280"]}],"id":[{"id":"10.13039\/501100017610","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2022,9]]},"DOI":"10.1109\/jssc.2022.3174418","type":"journal-article","created":{"date-parts":[[2022,5,19]],"date-time":"2022-05-19T20:27:58Z","timestamp":1652992078000},"page":"2658-2671","source":"Crossref","is-referenced-by-count":8,"title":["A 164-$\\mu$ W 915-MHz Sub-Sampling Phase-Tracking Zero-IF Receiver With 5-Mb\/s Data Rate for Short-Range Applications"],"prefix":"10.1109","volume":"57","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5800-8799","authenticated-orcid":false,"given":"Yanshu","family":"Guo","sequence":"first","affiliation":[{"name":"School of Integrated Circuits, Tsinghua University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6499-4353","authenticated-orcid":false,"given":"Zhongyuan","family":"Fang","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits, Tsinghua University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8512-3701","authenticated-orcid":false,"given":"Kai","family":"Tang","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"}]},{"given":"Zhaoyang","family":"Weng","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"}]},{"given":"Chuanshi","family":"Yang","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"}]},{"given":"Nan","family":"Wang","sequence":"additional","affiliation":[{"name":"Institute of Microelectronics, Singapore"}]},{"given":"Eldwin J.","family":"Ng","sequence":"additional","affiliation":[{"name":"Institute of Microelectronics, Singapore"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6567-0759","authenticated-orcid":false,"given":"Zhihua","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5696-8403","authenticated-orcid":false,"given":"Chun-Huat","family":"Heng","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, National University of Singapore, Singapore"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4911-0748","authenticated-orcid":false,"given":"Hanjun","family":"Jiang","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits, Tsinghua University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5768-367X","authenticated-orcid":false,"given":"Yuanjin","family":"Zheng","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits, Tsinghua University, Beijing, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.3389\/fnins.2021.697731"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1038\/s41551-020-0518-9"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2013.6487741"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TNSRE.2019.2900455"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2355822"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2017.8094604"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2017.2724768"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2654322"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2017.7993647"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2015.7063017"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2017.2756622"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2021.3061560"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2815987"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2883398"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3005788"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3005797"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC19947.2020.9063083"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2875116"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2365092"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2018.8310375"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2021.3070782"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC.2018.8428990"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2018.2878342"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2963589"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2014.6757385"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.857364"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.848027"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/78.134430"},{"key":"ref29","volume-title":"RF Microelectronics","author":"Razavi","year":"1998"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2017.2705698"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2402214"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2008.919495"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/WAMICON.2015.7120411"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2918940"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2688384"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-15-0561-4"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC49505.2020.9218315"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2021.3066420"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC19947.2020.9062973"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2019.8780372"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/4\/9866858\/09778186.pdf?arnumber=9778186","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,22]],"date-time":"2024-01-22T22:08:15Z","timestamp":1705961295000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9778186\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,9]]},"references-count":40,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2022.3174418","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,9]]}}}