{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,5]],"date-time":"2026-06-05T05:11:05Z","timestamp":1780636265670,"version":"3.54.1"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2022,10,1]],"date-time":"2022-10-01T00:00:00Z","timestamp":1664582400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"name":"A*STAR AME Nanosystems through the Edge Program","award":["A18A4b0055"],"award-info":[{"award-number":["A18A4b0055"]}]},{"name":"A*STAR AME Wavefront Computing Program","award":["A18A4b0055"],"award-info":[{"award-number":["A18A4b0055"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2022,10]]},"DOI":"10.1109\/jssc.2022.3182102","type":"journal-article","created":{"date-parts":[[2022,7,4]],"date-time":"2022-07-04T20:01:12Z","timestamp":1656964872000},"page":"3036-3047","source":"Crossref","is-referenced-by-count":10,"title":["An Ultrasound ASIC With Universal Energy Recycling for >7-m All-Weather Metamorphic Robotic Vision"],"prefix":"10.1109","volume":"57","author":[{"given":"Han","family":"Wu","sequence":"first","affiliation":[{"name":"Department of Electrical and Computer Engineering, National University of Singapore, Queenstown, Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Miaolin","family":"Zhang","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, National University of Singapore, Queenstown, Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6617-5896","authenticated-orcid":false,"given":"Zhichun","family":"Shao","sequence":"additional","affiliation":[{"name":"Department of Mechanical Engineering, University of California at Berkeley, Berkeley, CA, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jiaqi","family":"Guo","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, National University of Singapore, Queenstown, Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6044-9841","authenticated-orcid":false,"given":"Kian Ann","family":"Ng","sequence":"additional","affiliation":[{"name":"Digipen Institute of Technology, Queenstown, Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7083-624X","authenticated-orcid":false,"given":"Liwei","family":"Lin","sequence":"additional","affiliation":[{"name":"Department of Mechanical Engineering, University of California at Berkeley, Berkeley, CA, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3150-1727","authenticated-orcid":false,"given":"Jerald","family":"Yoo","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, National University of Singapore, Queenstown, Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.829927"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.848029"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2356197"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42613.2021.9365838"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42613.2021.9365961"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2017.2673547"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MEMS51782.2021.9375173"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2015.7168959"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/OJSSCS.2021.3115398"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2021.3120886"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/4.890317"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2364975"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JMEMS.2021.3090374"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/A-SSCC53895.2021.9634764"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/MEMSYS.2018.8346748"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.3390\/s20226532"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TUFFC.2019.2921983"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2014.2327455"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2015.7063000"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2019.8662531"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/IPEC.2012.6522653"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3049560"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42613.2021.9365826"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/LPE.1994.573220"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42613.2021.9365808"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ASSCC.2016.7844167"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/PHYCMP.1992.615554"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2018.8310247"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2016.7417977"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2274895"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/4\/9900477\/09813572.pdf?arnumber=9813572","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T03:50:58Z","timestamp":1706759458000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9813572\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,10]]},"references-count":30,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2022.3182102","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,10]]}}}