{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,3]],"date-time":"2026-10-03T17:29:43Z","timestamp":1791048583499,"version":"4.1.0"},"reference-count":20,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2023,2,1]],"date-time":"2023-02-01T00:00:00Z","timestamp":1675209600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,2,1]],"date-time":"2023-02-01T00:00:00Z","timestamp":1675209600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,2,1]],"date-time":"2023-02-01T00:00:00Z","timestamp":1675209600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100003725","name":"National Research Foundation of Korea (NRF) grant funded by the Korea government","doi-asserted-by":"publisher","award":["NRF-2021R1A2B5B01002874"],"award-info":[{"award-number":["NRF-2021R1A2B5B01002874"]}],"id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Institute of Information & Communications Technology Planning & Evaluation (IITP) grant funded by the Korea government"},{"name":"Design of Time-based Circuit for Low Power Integrated System","award":["2020-0-00850"],"award-info":[{"award-number":["2020-0-00850"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2023,2]]},"DOI":"10.1109\/jssc.2022.3185988","type":"journal-article","created":{"date-parts":[[2022,7,7]],"date-time":"2022-07-07T15:27:38Z","timestamp":1657207658000},"page":"508-519","source":"Crossref","is-referenced-by-count":21,"title":["A 43.3-\u03bcW Biopotential Amplifier With Tolerance to Common-Mode Interference of 18 V\n                    <sub>pp<\/sub>\n                    and T-CMRR of 105 dB in 180-nm CMOS"],"prefix":"10.1109","volume":"58","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3167-0440","authenticated-orcid":false,"given":"Nahmil","family":"Koo","sequence":"first","affiliation":[{"name":"Samsung Advanced Institute of Technology, Suwon, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hyojun","family":"Kim","sequence":"additional","affiliation":[{"name":"Korea Aerospace Research Institute, Daejeon, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7938-2694","authenticated-orcid":false,"given":"Seonghwan","family":"Cho","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2019.8662373"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42613.2021.9365971"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3005768"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC19947.2020.9063112"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2512935"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC19947.2020.9062928"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2359962"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2018.8310389"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC19947.2020.9063054"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/RBME.2010.2084078"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42614.2022.9731667"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2018.8502432"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2831231"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.23919\/VLSIC.2017.8008469"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2364036"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.23919\/VLSIC.2017.8008470"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2018.8357025"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2422798"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2018.8502270"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.5573\/JSTS.2010.10.4.300"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/4\/10027566\/09817143.pdf?arnumber=9817143","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T00:45:23Z","timestamp":1706748323000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9817143\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,2]]},"references-count":20,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2022.3185988","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,2]]}}}