{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,29]],"date-time":"2026-10-29T15:12:36Z","timestamp":1793286756857,"version":"4.5.0"},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2023,5,1]],"date-time":"2023-05-01T00:00:00Z","timestamp":1682899200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/501100002341","name":"Academy of Finland","doi-asserted-by":"publisher","award":["314404"],"award-info":[{"award-number":["314404"]}],"id":[{"id":"10.13039\/501100002341","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002341","name":"Academy of Finland","doi-asserted-by":"publisher","award":["323719"],"award-info":[{"award-number":["323719"]}],"id":[{"id":"10.13039\/501100002341","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2023,5]]},"DOI":"10.1109\/jssc.2022.3212549","type":"journal-article","created":{"date-parts":[[2022,11,3]],"date-time":"2022-11-03T17:56:10Z","timestamp":1667498170000},"page":"1350-1361","source":"Crossref","is-referenced-by-count":30,"title":["CMOS SPAD Line Sensor With Fine-Tunable Parallel Connected Time-to-Digital Converters for Raman Spectroscopy"],"prefix":"10.1109","volume":"58","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-2122-3786","authenticated-orcid":false,"given":"Tuomo","family":"Talala","sequence":"first","affiliation":[{"name":"Circuits and Systems Research Unit, University of Oulu, Oulu, Finland"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0684-746X","authenticated-orcid":false,"given":"Eetu","family":"Parkkinen","sequence":"additional","affiliation":[{"name":"Circuits and Systems Research Unit, University of Oulu, Oulu, Finland"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8131-9766","authenticated-orcid":false,"given":"Ilkka","family":"Nissinen","sequence":"additional","affiliation":[{"name":"Circuits and Systems Research Unit, University of Oulu, Oulu, Finland"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1364\/optica.386574"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.2993722"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSTQE.2018.2867439"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2905163"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1038\/srep44108"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2467170"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2282091"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2018.2813531"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1117\/12.2508459"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3054679"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2014.2361610"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2894355"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2019.2923263"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1364\/oe.21.031632"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-021-99004-6"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-020-80813-0"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1039\/c9an01136f"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1364\/boe.2.000149"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6463\/ac276e"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1111\/j.1365-2133.2008.08577.x"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1002\/jrs.4313"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1002\/jrs.4369"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2913222"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/abb044"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.3390\/s21134287"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.3390\/s21082579"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.2966119"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1364\/ao.59.000433"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/SENSORS43011.2019.8956897"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ESSDERC.2018.8486883"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2010.2087992"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2014.2327338"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1364\/ol.434418"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1021\/ac062160k"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.3989\/gya.0332171"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.sbsr.2015.09.003"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/4\/10107667\/09925200.pdf?arnumber=9925200","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,22]],"date-time":"2024-01-22T17:13:40Z","timestamp":1705943620000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9925200\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,5]]},"references-count":36,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2022.3212549","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,5]]}}}