{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,12]],"date-time":"2026-05-12T16:20:56Z","timestamp":1778602856681,"version":"3.51.4"},"reference-count":7,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2023,1]]},"DOI":"10.1109\/jssc.2022.3225378","type":"journal-article","created":{"date-parts":[[2022,12,7]],"date-time":"2022-12-07T03:11:44Z","timestamp":1670382704000},"page":"102-110","source":"Crossref","is-referenced-by-count":4,"title":["Deterministic Frequency and Voltage Enhancements on the POWER10 Processor"],"prefix":"10.1109","volume":"58","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1662-9220","authenticated-orcid":false,"given":"Brian","family":"Vanderpool","sequence":"first","affiliation":[{"name":"IBM, Rochester, MN, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3124-4265","authenticated-orcid":false,"given":"Phillip J.","family":"Restle","sequence":"additional","affiliation":[{"name":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3148-4082","authenticated-orcid":false,"given":"Eric","family":"Fluhr","sequence":"additional","affiliation":[{"name":"IBM, Austin, TX, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Gregory","family":"Still","sequence":"additional","affiliation":[{"name":"IBM, Raleigh, NC, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Francesco A.","family":"Campisano","sequence":"additional","affiliation":[{"name":"IBM, Austin, TX, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ian","family":"Charmichael","sequence":"additional","affiliation":[{"name":"IBM, Austin, TX, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Eric","family":"Marz","sequence":"additional","affiliation":[{"name":"IBM, Essex Junction, VT, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rahul","family":"Batra","sequence":"additional","affiliation":[{"name":"IBM, Austin, TX, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Richard","family":"Willaman","sequence":"additional","affiliation":[{"name":"IBM, Austin, TX, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2007.373462"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2018.8310303"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3043786"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42614.2022.9731746"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42614.2022.9731594"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1147\/JRD.2020.3008143"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2017.7870449"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/4\/9999561\/09971797.pdf?arnumber=9971797","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T02:48:37Z","timestamp":1706755717000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9971797\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,1]]},"references-count":7,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2022.3225378","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,1]]}}}