{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,24]],"date-time":"2026-01-24T16:15:51Z","timestamp":1769271351263,"version":"3.49.0"},"reference-count":50,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T00:00:00Z","timestamp":1706745600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T00:00:00Z","timestamp":1706745600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T00:00:00Z","timestamp":1706745600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100003725","name":"Pioneer Research Center Program through the National Research Foundation (NRF), Korea","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Ministry of Science and Information and Communications Technology (ICT), Korea","award":["2022M3C1A3091627"],"award-info":[{"award-number":["2022M3C1A3091627"]}]},{"name":"Development of Creative Technology for ICT Program through the Electronics and Telecommunications Research Institute"},{"name":"Korea government","award":["23ZB1140"],"award-info":[{"award-number":["23ZB1140"]}]},{"name":"IC Design Center (IDEC), South Korea"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2024,2]]},"DOI":"10.1109\/jssc.2023.3300928","type":"journal-article","created":{"date-parts":[[2023,8,16]],"date-time":"2023-08-16T17:19:49Z","timestamp":1692206389000},"page":"528-539","source":"Crossref","is-referenced-by-count":15,"title":["A 15.4-ENOB, Fourth-Order Truncation-Error-Shaping NS-SAR-Nested \u0394\u03a3 Modulator With Boosted Input Impedance and Range for Biosignal Acquisition"],"prefix":"10.1109","volume":"59","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0568-0845","authenticated-orcid":false,"given":"Kyeongwon","family":"Jeong","sequence":"first","affiliation":[{"name":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3589-086X","authenticated-orcid":false,"given":"Sohmyung","family":"Ha","sequence":"additional","affiliation":[{"name":"Division of Engineering, New York University Abu Dhabi, Abu Dhabi, United Arab Emirates"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4580-2771","authenticated-orcid":false,"given":"Minkyu","family":"Je","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2528999"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2052403"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.23919\/vlsic.2017.8008543"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2364824"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/isscc42614.2022.9731776"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42614.2022.9731733"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2888845"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/cicc53496.2022.9772839"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2355822"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/A-SSCC53895.2021.9634834"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/3025453.3025692"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/3447993.3483252"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/3386901.3389032"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1212\/01.WNL.0000125184.88797.62"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TITB.2009.2017939"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1038\/s41569-020-00503-2"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1136\/hrt.80.6.570"},{"issue":"4","key":"ref18","first-page":"364","article-title":"Expected and experienced pain levels in electromyography","volume":"50","author":"Dikmen","year":"2013","journal-title":"Noro Psikiyatri Arsivi"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1111\/j.1528-1167.2010.02536.x"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.clinph.2014.01.006"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1038\/s41551-018-0323-x"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1146\/annurev.bioeng.10.061807.160518"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1007\/BF02441961"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1145\/3458864.3467680"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2018.2816464"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/VLSITechnologyandCir46769.2022.9830401"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2003.811979"},{"issue":"6","key":"ref28","doi-asserted-by":"crossref","first-page":"735","DOI":"10.1109\/TBCAS.2014.2298860","article-title":"A 0.45 V 100-channel neural-recording IC with sub-\u03bcW\/channel consumption in 0.18 \u03bcm CMOS","volume":"7","author":"Han","year":"2013","journal-title":"IEEE Trans. Biomed. Circuits Syst."},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2143610"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2810213"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2753824"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/vlsic.2018.8502264"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2876468"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2870555"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.2991526"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2624989"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2959479"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3018478"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/isscc42613.2021.9365985"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3112635"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/isscc42614.2022.9731742"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/a-sscc56115.2022.9980716"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2022.3193944"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1002\/9781119258308"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2005.853909"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.2010973"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.23919\/VLSIC.2017.8008492"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2143870"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2274852"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/isscc42615.2023.10067537"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/4\/10416291\/10221702.pdf?arnumber=10221702","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T13:27:51Z","timestamp":1706794071000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10221702\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,2]]},"references-count":50,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2023.3300928","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,2]]}}}