{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,20]],"date-time":"2025-08-20T13:02:30Z","timestamp":1755694950546,"version":"3.37.3"},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T00:00:00Z","timestamp":1706745600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T00:00:00Z","timestamp":1706745600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T00:00:00Z","timestamp":1706745600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2019YFB2204900"],"award-info":[{"award-number":["2019YFB2204900"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100013314","name":"Higher Education Discipline Innovation Project","doi-asserted-by":"publisher","award":["B18001"],"award-info":[{"award-number":["B18001"]}],"id":[{"id":"10.13039\/501100013314","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2024,2]]},"DOI":"10.1109\/jssc.2023.3307427","type":"journal-article","created":{"date-parts":[[2023,9,6]],"date-time":"2023-09-06T17:30:27Z","timestamp":1694021427000},"page":"435-448","source":"Crossref","is-referenced-by-count":8,"title":["A 0.39-mm<sup>2<\/sup> Stacked Standard-CMOS Humidity Sensor Using a Charge-Redistribution Correlated Level Shifting Floating Inverter Amplifier and a VCO-Based Zoom CDC"],"prefix":"10.1109","volume":"59","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5930-6731","authenticated-orcid":false,"given":"Heyi","family":"Li","sequence":"first","affiliation":[{"name":"Beijing Laboratory of Future IC Technology and Science, School of Integrated Circuit, Peking University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-5084-9007","authenticated-orcid":false,"given":"Kaixuan","family":"Du","sequence":"additional","affiliation":[{"name":"Beijing Laboratory of Future IC Technology and Science, School of Integrated Circuit, Peking University, Beijing, China"}]},{"given":"Yuanxin","family":"Bao","sequence":"additional","affiliation":[{"name":"Beijing Laboratory of Future IC Technology and Science, School of Integrated Circuit, Peking University, Beijing, China"}]},{"given":"Yanchi","family":"Dong","sequence":"additional","affiliation":[{"name":"Beijing Laboratory of Future IC Technology and Science, School of Integrated Circuit, Peking University, Beijing, China"}]},{"given":"Jiayoon","family":"Ru","sequence":"additional","affiliation":[{"name":"Beijing Laboratory of Future IC Technology and Science, School of Integrated Circuit, Peking University, Beijing, China"}]},{"given":"Han","family":"Xiao","sequence":"additional","affiliation":[{"name":"Advanced Institute of Information Technology, Peking University, Hangzhou, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7794-0816","authenticated-orcid":false,"given":"Hao","family":"Zhang","sequence":"additional","affiliation":[{"name":"Advanced Institute of Information Technology, Peking University, Hangzhou, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1044-214X","authenticated-orcid":false,"given":"Zhixuan","family":"Wang","sequence":"additional","affiliation":[{"name":"Beijing Laboratory of Future IC Technology and Science, School of Integrated Circuit, Peking University, Beijing, China"}]},{"given":"Yi","family":"Zhong","sequence":"additional","affiliation":[{"name":"Department of Electronic Engineering, Tsinghua University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7933-3673","authenticated-orcid":false,"given":"Linxiao","family":"Shen","sequence":"additional","affiliation":[{"name":"Beijing Laboratory of Future IC Technology and Science, School of Integrated Circuit, Peking University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0599-7762","authenticated-orcid":false,"given":"Le","family":"Ye","sequence":"additional","affiliation":[{"name":"Beijing Laboratory of Future IC Technology and Science, School of Integrated Circuit, Peking University, Beijing, China"}]},{"given":"Ru","family":"Huang","sequence":"additional","affiliation":[{"name":"Beijing Laboratory of Future IC Technology and Science, School of Integrated Circuit, Peking University, Beijing, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2016.06.113"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2006.874029"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2014.02.078"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2010.09.016"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2015.03.069"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2011.12.037"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2017.08.212"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2017.01.010"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/tbme.2016.2521662"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2016.09.144"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2013.2275661"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2019.2930140"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2020.2989585"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2021.3114189"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/vlsicircuits18222.2020.9162817"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2020.3005812"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2019.2959479"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2017.2693244"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/jetcas.2015.2502166"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/a-sscc56115.2022.9980716"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2022.3208144"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2019.2960485"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/isscc19947.2020.9063058"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/isscc42613.2021.9365753"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2021.3108620"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/cicc51472.2021.9431499"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2008.2006312"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2010.2073190"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2012.2217865"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2022.3171790"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.2017.7870469"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2019.2941007"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/vlsic.2016.7573465"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2017.2693237"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2012.2225738"},{"volume-title":"SHT35 Datasheet","year":"2022","key":"ref36"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/4\/10416291\/10241982.pdf?arnumber=10241982","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,10]],"date-time":"2025-01-10T20:28:30Z","timestamp":1736540910000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10241982\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,2]]},"references-count":36,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2023.3307427","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"type":"print","value":"0018-9200"},{"type":"electronic","value":"1558-173X"}],"subject":[],"published":{"date-parts":[[2024,2]]}}}