{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,28]],"date-time":"2026-03-28T19:34:17Z","timestamp":1774726457264,"version":"3.50.1"},"reference-count":22,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2023,12,1]],"date-time":"2023-12-01T00:00:00Z","timestamp":1701388800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,12,1]],"date-time":"2023-12-01T00:00:00Z","timestamp":1701388800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,12,1]],"date-time":"2023-12-01T00:00:00Z","timestamp":1701388800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2023,12]]},"DOI":"10.1109\/jssc.2023.3308554","type":"journal-article","created":{"date-parts":[[2023,9,18]],"date-time":"2023-09-18T13:57:08Z","timestamp":1695045428000},"page":"3433-3441","source":"Crossref","is-referenced-by-count":15,"title":["A Sub-1 V Capacitively Biased BJT-Based Temperature Sensor With an Inaccuracy of \u00b10.15 \u00b0C (3\u03c3) From\u201455 \u00b0C to 125 \u00b0C"],"prefix":"10.1109","volume":"58","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-3655-0912","authenticated-orcid":false,"given":"Zhong","family":"Tang","sequence":"first","affiliation":[{"name":"Microelectronics Department, Electronic Instrumentation Laboratory, Faculty of Electrical Engineering, Mathematics and Computer Science (EEMCS), Delft University of Technology, CD Delft, The Netherlands"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5409-3367","authenticated-orcid":false,"given":"Sining","family":"Pan","sequence":"additional","affiliation":[{"name":"Microelectronics Department, Electronic Instrumentation Laboratory, Faculty of Electrical Engineering, Mathematics and Computer Science (EEMCS), Delft University of Technology, CD Delft, The Netherlands"}]},{"given":"Milo\u0161","family":"Grubor","sequence":"additional","affiliation":[{"name":"Microelectronics Department, Electronic Instrumentation Laboratory, Faculty of Electrical Engineering, Mathematics and Computer Science (EEMCS), Delft University of Technology, CD Delft, The Netherlands"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2992-5467","authenticated-orcid":false,"given":"Kofi A. A.","family":"Makinwa","sequence":"additional","affiliation":[{"name":"Microelectronics Department, Electronic Instrumentation Laboratory, Faculty of Electrical Engineering, Mathematics and Computer Science (EEMCS), Delft University of Technology, CD Delft, The Netherlands"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2017.7870310"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2214831"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/LSSC.2020.3005784"},{"key":"ref4","volume-title":"Smart Temperature Sensor Survey","author":"Makinwa","year":"2023"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.858476"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2638464"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/LSSC.2018.2827883"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.2014.6757409"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2788878"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/lssc.2021.3072989"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2020.2999272"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/LSSC.2019.2938140"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/cicc48029.2020.9075873"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/LSSC.2021.3124471"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1119\/1.1578070"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/asscc.2018.8579306"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/VLSITechnologyandCir46769.2022.9830266"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42615.2023.10067695"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2018.2853649"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2953834"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2669022"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/isscc42615.2023.10067530"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/4\/10328904\/10254532.pdf?arnumber=10254532","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,20]],"date-time":"2025-10-20T17:49:35Z","timestamp":1760982575000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10254532\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,12]]},"references-count":22,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2023.3308554","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,12]]}}}